Elad Sommer

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Nes-Harim, IL

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Patents Grantslast 30 patents

Information Patent Grant
Local shape deviation in a semiconductor specimen
- Patent number 11,686,571
- Issue date Jun 27, 2023
- Applied Materials Israel Ltd.
- Roman Kris
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Evaluating an intermediate product related to a three-dimensional N...
- Patent number 11,476,081
- Issue date Oct 18, 2022
- Applied Materials Israel Ltd.
- Roman Kris
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Evaluating a hole formed in an intermediate product
- Patent number 11,056,404
- Issue date Jul 6, 2021
- Applied Materials Israel Ltd.
- Roman Kris
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
EXAMINATION OF A HOLE FORMED IN A SEMICONDUCTOR SPECIMEN
- Publication number 20230420308
- Publication date Dec 28, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Rafael BISTRITZER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LOCAL SHAPE DEVIATION IN A SEMICONDUCTOR SPECIMEN
- Publication number 20230069303
- Publication date Mar 2, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Roman KRIS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EVALUATING A HOLE FORMED IN AN INTERMEDIATE PRODUCT
- Publication number 20210193536
- Publication date Jun 24, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Roman Kris
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EVALUATING AN INTERMEDIATE PRODUCT RELATED TO A THREE-DIMENSIONAL N...
- Publication number 20210066026
- Publication date Mar 4, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Roman Kris
- H01 - BASIC ELECTRIC ELEMENTS