Eldad Langmans

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Haifa, IL

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Patents Grantslast 30 patents

Information Patent Grant
System for inspecting a backside of a wafer
- Patent number 10,215,707
- Issue date Feb 26, 2019
- CAMTEK LTD.
- Zehava Ben Ezer
- G01 - MEASURING TESTING
Information Patent Grant
High throughput and low cost height triangulation system and method
- Patent number 9,756,313
- Issue date Sep 5, 2017
- Camtek Ltd.
- Shimon Koren
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and system for wafer registration
- Patent number 8,731,274
- Issue date May 20, 2014
- Camtek Ltd.
- Eldad Langmans
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR INSPECTING A BACKSIDE OF A WAFER
- Publication number 20170010220
- Publication date Jan 12, 2017
- Camtek LTD.
- Zehava Ben Ezer
- G01 - MEASURING TESTING
Information Patent Application
HIGH THROUGHPUT AND LOW COST HEIGHT TRIANGULATION SYSTEM AND METHOD
- Publication number 20140362208
- Publication date Dec 11, 2014
- CAMTEK LTD
- Shimon Koren
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR WAFER REGISTRATION
- Publication number 20120195490
- Publication date Aug 2, 2012
- Eldad Langmans
- G06 - COMPUTING CALCULATING COUNTING