Elfido Coss Jr.

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Parallel fault detection
- Patent number 8,359,494
- Issue date Jan 22, 2013
- GLOBALFOUNDRIES Inc.
- Elfido Coss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adjusting a trace data rate based upon a tool state
- Patent number 6,834,211
- Issue date Dec 21, 2004
- Advanced Micro Devices, Inc.
- Elfido Coss
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Process control based upon a metrology delay
- Patent number 6,834,213
- Issue date Dec 21, 2004
- Advanced Micro Devices, Inc.
- Thomas J. Sonderman
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for dynamically monitoring system components i...
- Patent number 6,831,555
- Issue date Dec 14, 2004
- Advanced Micro Devices, Inc.
- Michael Lee Miller
- G05 - CONTROLLING REGULATING
Information Patent Grant
Determining a possible cause of a fault in a semiconductor fabricat...
- Patent number 6,790,680
- Issue date Sep 14, 2004
- Advanced Micro Devices, Inc.
- Jason A. Grover
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of dynamically enabling additional sensors based upon initia...
- Patent number 6,792,389
- Issue date Sep 14, 2004
- Advanced Micro Devices, Inc.
- Sam H. Allen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of processing substrates based upon substrate orientation
- Patent number 6,778,876
- Issue date Aug 17, 2004
- Advanced Micro Devices, Inc.
- Elfido Coss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Identifying a cause of a fault based on a process controller output
- Patent number 6,778,873
- Issue date Aug 17, 2004
- Advanced Micro Devices, Inc.
- Jin Wang
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Operating a processing tool in a degraded mode upon detecting a fault
- Patent number 6,763,278
- Issue date Jul 13, 2004
- Advanced Micro Devices, Inc.
- Elfido Coss
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Determination of a process flow based upon fault detection analysis
- Patent number 6,740,534
- Issue date May 25, 2004
- Advanced Micro Devices, Inc.
- Ernest D. Adams
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for fault detection of a processing tool and c...
- Patent number 6,725,402
- Issue date Apr 20, 2004
- Advanced Micro Devices, Inc.
- Elfido Coss
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Integration of business rule parameters in priority setting of wafe...
- Patent number 6,711,450
- Issue date Mar 23, 2004
- Advanced Micro Devices, Inc.
- Michael R. Conboy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer rotation in wafer handling devices
- Patent number 6,699,004
- Issue date Mar 2, 2004
- Advanced Micro Devices, Inc.
- Michael R. Conboy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fault detection control system using dual bus architecture, and met...
- Patent number 6,697,696
- Issue date Feb 24, 2004
- Advanced Micro Devices, Inc.
- Susan Hickey
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for determining wafer identity and orientation
- Patent number 6,666,337
- Issue date Dec 23, 2003
- Advanced Micro Devices, Inc.
- Michael R. Conboy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer rotation randomization in cluster tool processing
- Patent number 6,662,070
- Issue date Dec 9, 2003
- Advanced Micro Devices, Inc.
- Michael R. Conboy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for scheduled controller execution based upon...
- Patent number 6,640,148
- Issue date Oct 28, 2003
- Advanced Micro Devices, Inc.
- Michael L. Miller
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Wafer rotation randomization for process defect detection in semico...
- Patent number 6,625,556
- Issue date Sep 23, 2003
- Advanced Micro Devices, Inc.
- Michael R. Conboy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer rotation in semiconductor processing
- Patent number 6,622,111
- Issue date Sep 16, 2003
- Advanced Micro Devices, Inc.
- Michael R. Conboy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for monitoring tool health
- Patent number 6,594,589
- Issue date Jul 15, 2003
- Advanced Micro Devices, Inc.
- Elfido Coss
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for using latency time as a run-to-run control...
- Patent number 6,571,371
- Issue date May 27, 2003
- Advanced Micro Devices, Inc.
- Elfido Coss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for generating real-time data from static files
- Patent number 6,556,882
- Issue date Apr 29, 2003
- Advanced Micro Devices, Inc.
- Michael R. Conboy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for fault detection of a processing tool in an...
- Patent number 6,546,508
- Issue date Apr 8, 2003
- Advanced Micro Devices, Inc.
- Thomas Sonderman
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for integration of real-time tool data and in-...
- Patent number 6,532,555
- Issue date Mar 11, 2003
- Advanced Micro Devices, Inc.
- Michael Lee Miller
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for implementing corrected species by monitori...
- Patent number 6,465,263
- Issue date Oct 15, 2002
- Advanced Micro Devices, Inc.
- Elfido Coss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated reticle sorter and stocker
- Patent number 6,457,587
- Issue date Oct 1, 2002
- Advanced Micro Devices, Inc.
- Michael R. Conboy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Managing a semiconductor fabrication facility using wafer lot and c...
- Patent number 6,449,522
- Issue date Sep 10, 2002
- Micro Devices, Inc.
- Michael R. Conboy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer fabrication system providing measurement data screening
- Patent number 6,446,022
- Issue date Sep 3, 2002
- Advanced Micro Devices, Inc.
- Elfido Coss
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for aligning wafers
- Patent number 6,440,821
- Issue date Aug 27, 2002
- Advanced Micro Devices, Inc.
- Michael R. Conboy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Integrated wafer stocker and sorter with integrity verification system
- Patent number 6,431,814
- Issue date Aug 13, 2002
- Advanced Micro Devices, Inc.
- Eric Christensen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Fault detection and control methodologies for ion implantation proc...
- Publication number 20050092939
- Publication date May 5, 2005
- Elfido Coss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System for brokering fault detection data
- Publication number 20030171885
- Publication date Sep 11, 2003
- Elfido Coss
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and apparatus for controlling wafer thickness uniformity in...
- Publication number 20020085212
- Publication date Jul 4, 2002
- William Jarrett Campbell
- H01 - BASIC ELECTRIC ELEMENTS

Elfido Coss Jr.

Person

Patents Grantslast 30 patents

Parallel fault detection

Adjusting a trace data rate based upon a tool state

Process control based upon a metrology delay

Method and apparatus for dynamically monitoring system components i...

Determining a possible cause of a fault in a semiconductor fabricat...

Method of dynamically enabling additional sensors based upon initia...

Methods of processing substrates based upon substrate orientation

Identifying a cause of a fault based on a process controller output

Operating a processing tool in a degraded mode upon detecting a fault

Determination of a process flow based upon fault detection analysis

Method and apparatus for fault detection of a processing tool and c...

Integration of business rule parameters in priority setting of wafe...

Wafer rotation in wafer handling devices

Fault detection control system using dual bus architecture, and met...

Method and apparatus for determining wafer identity and orientation

Wafer rotation randomization in cluster tool processing

Method and apparatus for scheduled controller execution based upon...

Wafer rotation randomization for process defect detection in semico...

Wafer rotation in semiconductor processing

Method and apparatus for monitoring tool health

Method and apparatus for using latency time as a run-to-run control...

Method and apparatus for generating real-time data from static files

Method and apparatus for fault detection of a processing tool in an...

Method and apparatus for integration of real-time tool data and in-...

Method and apparatus for implementing corrected species by monitori...

Integrated reticle sorter and stocker

Managing a semiconductor fabrication facility using wafer lot and c...

Wafer fabrication system providing measurement data screening

Method and apparatus for aligning wafers

Integrated wafer stocker and sorter with integrity verification system

Patents Applicationslast 30 patents

Fault detection and control methodologies for ion implantation proc...

System for brokering fault detection data

Method and apparatus for controlling wafer thickness uniformity in...