Elfido Coss, Jr.

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Associating data with workpieces and correlating the data with yiel...
- Patent number 8,321,048
- Issue date Nov 27, 2012
- Advanced Micro Devices, Inc.
- Elfido Coss, Jr.
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for correlating test equipment health and test...
- Patent number 7,788,065
- Issue date Aug 31, 2010
- GLOBALFOUNDRIES Inc.
- Elfido Coss, Jr.
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for analyzing process equipment processing vari...
- Patent number 7,783,455
- Issue date Aug 24, 2010
- Globalfoundries Inc.
- Elfido Coss, Jr.
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for matching test equipment calibration
- Patent number 7,716,004
- Issue date May 11, 2010
- Advanced Micro Devices, Inc.
- Elfido Coss, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Initiating test runs based on fault detection results
- Patent number 7,581,140
- Issue date Aug 25, 2009
- Advanced Micro Devices, Inc.
- Alexander J. Pasadyn
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for fault detection classification of multiple...
- Patent number 7,321,993
- Issue date Jan 22, 2008
- Advanced Micro Devices, Inc.
- Richard J. Markle
- G05 - CONTROLLING REGULATING
Information Patent Grant
Fault notification based on a severity level
- Patent number 7,200,779
- Issue date Apr 3, 2007
- Advanced Micro Devices, Inc.
- Elfido Coss, Jr.
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of dynamically designing a preventative maintenance schedule...
- Patent number 7,130,769
- Issue date Oct 31, 2006
- Advanced Micro Devices, Inc.
- Sam H. Allen, Jr.
- G05 - CONTROLLING REGULATING
Information Patent Grant
Automated material handling system for a manufacturing facility div...
- Patent number 7,092,779
- Issue date Aug 15, 2006
- Michael R. Conboy
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Routing workpieces based upon detecting a fault
- Patent number 7,051,250
- Issue date May 23, 2006
- Advanced Micro Devices, Inc.
- Sam H. Allen, Jr.
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Management of multiple types of empty carriers in automated materia...
- Patent number 7,039,495
- Issue date May 2, 2006
- Advance Micro Devices, Inc.
- Michael R. Conboy
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Conflict resolution among multiple controllers
- Patent number 7,031,793
- Issue date Apr 18, 2006
- Advanced Micro Devices, Inc.
- Naomi M. Jenkins
- G05 - CONTROLLING REGULATING
Information Patent Grant
Automated system for extracting and combining tool trace data and w...
- Patent number 6,968,303
- Issue date Nov 22, 2005
- Advanced Micro Devices, Inc.
- Qingsu Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fault detection and control methodologies for ion implantation proc...
- Patent number 6,960,774
- Issue date Nov 1, 2005
- Advanced Micro Devices, Inc.
- Elfido Coss, Jr.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for performing fault detection using data from...
- Patent number 6,954,883
- Issue date Oct 11, 2005
- Advanced Micro Devices, Inc.
- Elfido Coss, Jr.
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Scheduling method for automated work-cell transfer system
- Patent number 6,928,333
- Issue date Aug 9, 2005
- Advance Micro Devices, Inc.
- Michael R. Conboy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Predicting process excursions based upon tool state variables
- Patent number 6,905,895
- Issue date Jun 14, 2005
- Advanced Micro Devices, Inc.
- Elfido Coss, Jr.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for requesting trace data reports from FDC semiconductor fab...
- Patent number 6,871,112
- Issue date Mar 22, 2005
- Advanced Micro Devices, Inc.
- Elfido Coss, Jr.
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Updating process controller based upon fault detection analysis
- Patent number 6,871,114
- Issue date Mar 22, 2005
- Eric O. Green
- G05 - CONTROLLING REGULATING
Information Patent Grant
Fault detection system with real-time database
- Patent number 6,868,512
- Issue date Mar 15, 2005
- Advanced Micro Devices, Inc.
- Michael L. Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for controlling wafer thickness uniformity in...
- Patent number 6,850,322
- Issue date Feb 1, 2005
- Advanced Micro Devices, Inc.
- William Jarrett Campbell
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR CORRELATING TEST EQUIPMENT HEALTH AND TEST...
- Publication number 20090012737
- Publication date Jan 8, 2009
- Elfido Coss, JR.
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for matching test equipment calibration
- Publication number 20090012730
- Publication date Jan 8, 2009
- ELFIDO COSS, JR.
- G01 - MEASURING TESTING

Elfido Coss, Jr.

Person

Patents Grantslast 30 patents

Associating data with workpieces and correlating the data with yiel...

Method and apparatus for correlating test equipment health and test...

Methods and systems for analyzing process equipment processing vari...

Method and apparatus for matching test equipment calibration

Initiating test runs based on fault detection results

Method and apparatus for fault detection classification of multiple...

Fault notification based on a severity level

Method of dynamically designing a preventative maintenance schedule...

Automated material handling system for a manufacturing facility div...

Routing workpieces based upon detecting a fault

Management of multiple types of empty carriers in automated materia...

Conflict resolution among multiple controllers

Automated system for extracting and combining tool trace data and w...

Fault detection and control methodologies for ion implantation proc...

Method and apparatus for performing fault detection using data from...

Scheduling method for automated work-cell transfer system

Predicting process excursions based upon tool state variables

Method for requesting trace data reports from FDC semiconductor fab...

Updating process controller based upon fault detection analysis

Fault detection system with real-time database

Method and apparatus for controlling wafer thickness uniformity in...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR CORRELATING TEST EQUIPMENT HEALTH AND TEST...

Method and apparatus for matching test equipment calibration