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Eli A. Richards
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Catonsville, MD, US
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Patents Grants
last 30 patents
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Patent Grant
In-situ seal integrity monitoring
Patent number
7,281,412
Issue date
Oct 16, 2007
John A. Olenick
G01 - MEASURING TESTING
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Patent Grant
Complementary metal-oxide semiconductor xylophone bar magnetometer...
Patent number
7,064,541
Issue date
Jun 20, 2006
The Johns Hopkins University
Eli A. Richards
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
In-situ seal integrity monitoring
Publication number
20070051193
Publication date
Mar 8, 2007
John A. Olenick
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Application
Complementary metal-oxide semiconductor xylophone bar magnetometer...
Publication number
20050030115
Publication date
Feb 10, 2005
Eli A. Richards
H03 - BASIC ELECTRONIC CIRCUITRY