Eli Cheifetz

Person

Ramat Gan, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle detection system
- Patent number 11,322,333
- Issue date May 3, 2022
- EL-MUL TECHNOLOGIES LTD.
- Dmitry Shur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle detection system
- Patent number 11,031,210
- Issue date Jun 8, 2021
- EL-MUL TECHNOLOGIES LTD.
- Dmitry Shur
- G02 - OPTICS
Information Patent Grant
Particle detection assembly, system and method
- Patent number 10,910,193
- Issue date Feb 2, 2021
- EL-MUL TECHNOLOGIES LTD.
- Eli Cheifetz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection assembly, system and method
- Patent number 10,236,155
- Issue date Mar 19, 2019
- EL-MUL TECHNOLOGIES LTD.
- Eli Cheifetz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron detection system
- Patent number 9,673,019
- Issue date Jun 6, 2017
- EL-MUL TECHNOLOGIES LTD.
- Eli Cheifetz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Position sensitive STEM detector
- Patent number 9,076,632
- Issue date Jul 7, 2015
- EL-MUL TECHNOLOGIES LTD.
- Silviu Reinhorn
- G01 - MEASURING TESTING
Information Patent Grant
Three modes particle detector
- Patent number 7,847,268
- Issue date Dec 7, 2010
- El-Mul Technologies, Ltd.
- Semyon Shofman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle detector for secondary ions and direct and or indirect sec...
- Patent number 7,417,235
- Issue date Aug 26, 2008
- El-Mul Technologies, Ltd.
- Armin Schon
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE DETECTION SYSTEM
- Publication number 20210280387
- Publication date Sep 9, 2021
- EL-MULTECHNOLOGIES LTD
- Dmitry SHUR
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DETECTION SYSTEM
- Publication number 20200312609
- Publication date Oct 1, 2020
- EL-MUL TECHNOLOGIES LTD.
- Dmitry SHUR
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER DETECTOR AND SYSTEM AND METHOD USING THE SAME
- Publication number 20200066502
- Publication date Feb 27, 2020
- Nova Measuring Instruments, Inc.
- Christopher F. BEVIS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE DETECTION ASSEMBLY, SYSTEM AND METHOD
- Publication number 20190259571
- Publication date Aug 22, 2019
- EL-MUL TECHNOLOGIES LTD.
- ELI CHEIFETZ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTION ASSEMBLY, SYSTEM AND METHOD
- Publication number 20170069459
- Publication date Mar 9, 2017
- EL-MUL TECHNOLOGIES LTD.
- ELI CHEIFETZ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON DETECTION SYSTEM
- Publication number 20160086765
- Publication date Mar 24, 2016
- EL-MUL TECHNOLOGIES LTD.
- ELI CHEIFETZ
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POSITION SENSITIVE STEM DETECTOR
- Publication number 20150034822
- Publication date Feb 5, 2015
- EL-MUL TECHNOLOGIES LTD.
- Silviu Reinhorn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion detection method and apparatus with scanning electron beam
- Publication number 20090309021
- Publication date Dec 17, 2009
- EL-MUL TECHNOLOGIES LTD.
- Armin Schon
- G01 - MEASURING TESTING
Information Patent Application
Three modes particle detector
- Publication number 20090294687
- Publication date Dec 3, 2009
- EL-MUL TECHNOLOGIES LTD.
- Semyon Shofman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle detector for secondary ions and direct and or indirect sec...
- Publication number 20060289748
- Publication date Dec 28, 2006
- El-Mul Technologies, Ltd.
- Armin Schon
- G01 - MEASURING TESTING

Eli Cheifetz

Person

Patents Grantslast 30 patents

Charged particle detection system

Charged particle detection system

Particle detection assembly, system and method

Detection assembly, system and method

Electron detection system

Position sensitive STEM detector

Three modes particle detector

Particle detector for secondary ions and direct and or indirect sec...

Patents Applicationslast 30 patents

CHARGED PARTICLE DETECTION SYSTEM

CHARGED PARTICLE DETECTION SYSTEM

MASS SPECTROMETER DETECTOR AND SYSTEM AND METHOD USING THE SAME

PARTICLE DETECTION ASSEMBLY, SYSTEM AND METHOD

DETECTION ASSEMBLY, SYSTEM AND METHOD

ELECTRON DETECTION SYSTEM

POSITION SENSITIVE STEM DETECTOR

Ion detection method and apparatus with scanning electron beam

Three modes particle detector

Particle detector for secondary ions and direct and or indirect sec...