Eli MOR

Person

Garden City, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for measuring erosion and calibrating position...
- Patent number 11,978,647
- Issue date May 7, 2024
- Applied Materials, Inc.
- Charles G. Potter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Autonomous substrate processing system
- Patent number 11,709,477
- Issue date Jul 25, 2023
- Applied Materials, Inc.
- Priyadarshi Panda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for measuring erosion and calibrating position...
- Patent number 11,521,872
- Issue date Dec 6, 2022
- Applied Materials, Inc.
- Charles G. Potter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measuring process kit centering
- Patent number 11,387,122
- Issue date Jul 12, 2022
- Applied Materials, Inc.
- Charles Potter
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring process kit centering
- Patent number 10,847,393
- Issue date Nov 24, 2020
- Applied Materials, Inc.
- Charles G. Potter
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Long range capacitive gap measurement in a wafer form sensor system
- Patent number 10,794,681
- Issue date Oct 6, 2020
- Applied Materials, Inc.
- Charles G. Potter
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL

Patents Applicationslast 30 patents

Information Patent Application
AUTONOMOUS SUBSTRATE PROCESSING SYSTEM
- Publication number 20230305531
- Publication date Sep 28, 2023
- Applied Materials, Inc.
- Priyadarshi Panda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING EROSION AND CALIBRATING POSITION...
- Publication number 20230052210
- Publication date Feb 16, 2023
- Applied Materials, Inc.
- Charles G. Potter
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTONOMOUS SUBSTRATE PROCESSING SYSTEM
- Publication number 20220214662
- Publication date Jul 7, 2022
- Applied Materials, Inc.
- Priyadarshi Panda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING PROCESS KIT CENTERING
- Publication number 20210035832
- Publication date Feb 4, 2021
- Charles Potter
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Application
LONG RANGE CAPACITIVE GAP MEASUREMENT IN A WAFER FORM SENSOR SYSTEM
- Publication number 20200072594
- Publication date Mar 5, 2020
- Applied Materials, Inc.
- Charles G. POTTER
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING PROCESS KIT CENTERING
- Publication number 20200075368
- Publication date Mar 5, 2020
- Applied Materials, Inc.
- Charles G. POTTER
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING EROSION AND CALIBRATING POSITION...
- Publication number 20200075367
- Publication date Mar 5, 2020
- Applied Materials, Inc.
- Charles G. Potter
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Method and apparatus for measuring erosion and calibrating position...

Autonomous substrate processing system

Method and apparatus for measuring erosion and calibrating position...

Method and apparatus for measuring process kit centering

Method and apparatus for measuring process kit centering

Long range capacitive gap measurement in a wafer form sensor system

Patents Applicationslast 30 patents

AUTONOMOUS SUBSTRATE PROCESSING SYSTEM

METHOD AND APPARATUS FOR MEASURING EROSION AND CALIBRATING POSITION...

AUTONOMOUS SUBSTRATE PROCESSING SYSTEM

METHOD AND APPARATUS FOR MEASURING PROCESS KIT CENTERING

LONG RANGE CAPACITIVE GAP MEASUREMENT IN A WAFER FORM SENSOR SYSTEM

METHOD AND APPARATUS FOR MEASURING PROCESS KIT CENTERING

METHOD AND APPARATUS FOR MEASURING EROSION AND CALIBRATING POSITION...