Eliezer Rosengaus

Person

Palo Alto, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for inspection of a specimen
- Patent number 11,204,330
- Issue date Dec 21, 2021
- KLA-Tencor Technologies Corporation
- Mehdi Vaez-Iravani
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for region-adaptive defect detection
- Patent number 10,535,131
- Issue date Jan 14, 2020
- KLA-Tencor Corporation
- Christopher Maher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Acquisition of information for a construction site
- Patent number 9,222,771
- Issue date Dec 29, 2015
- KLA-Tencor Corp.
- Eliezer Rosengaus
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for inspection of a specimen
- Patent number 9,068,917
- Issue date Jun 30, 2015
- KLA-Tencor Technologies Corp.
- Mehdi Vaez-Iravani
- G01 - MEASURING TESTING
Information Patent Grant
Digital pathology system
- Patent number 9,041,930
- Issue date May 26, 2015
- KLA-Tencor Corporation
- Scott Young
- G01 - MEASURING TESTING
Information Patent Grant
Status polling
- Patent number 8,645,100
- Issue date Feb 4, 2014
- KLA-Tencor Corporation
- Krishnamurthy Bhaskar
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system for hierarchical tissue analysis and classification
- Patent number 8,600,143
- Issue date Dec 3, 2013
- KLA-Tencor Corporation
- Ashok V. Kulkarni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for creating persistent data for a wafer and fo...
- Patent number 8,126,255
- Issue date Feb 28, 2012
- KLA-Tencor Corp.
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory load balancing
- Patent number 7,865,037
- Issue date Jan 4, 2011
- KLA-Tencor Corporation
- Krishnamurthy Bhaskar
- G01 - MEASURING TESTING
Information Patent Grant
Oblique incidence macro wafer inspection
- Patent number 7,724,362
- Issue date May 25, 2010
- KLA-Tencor Corporation
- Eliezer Rosengaus
- G01 - MEASURING TESTING
Information Patent Grant
Multi-spectral techniques for defocus detection
- Patent number 7,719,677
- Issue date May 18, 2010
- KLA-Tencor Corporation
- Eliezer Rosengaus
- G01 - MEASURING TESTING
Information Patent Grant
Mirror node process verification
- Patent number 7,602,958
- Issue date Oct 13, 2009
- KLA-Tencor Corporation
- Krishnamurthy Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Daisy chained topology
- Patent number 7,555,409
- Issue date Jun 30, 2009
- KLA-Tencor Corporation
- Krishnamurthy Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer inspection systems and methods for analyzing inspection data
- Patent number 7,417,724
- Issue date Aug 26, 2008
- KLA-Tencor Technologies Corp.
- Paul Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Surface scanning
- Patent number 7,397,553
- Issue date Jul 8, 2008
- KLA-Tencor Technologies Corporation
- Courosh Mehanian
- G01 - MEASURING TESTING
Information Patent Grant
Programmable image computer
- Patent number 7,379,838
- Issue date May 27, 2008
- KLA-Tencor Corporation
- Krishnamurthy Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Edge bead removal inspection by reflectometry
- Patent number 7,324,198
- Issue date Jan 29, 2008
- KLA-Tencor Corporation
- Eliezer Rosengaus
- G01 - MEASURING TESTING
Information Patent Grant
Wafer edge inspection apparatus
- Patent number 7,280,197
- Issue date Oct 9, 2007
- KLA-Tehcor Technologies Corporation
- Eliezer Rosengaus
- G01 - MEASURING TESTING
Information Patent Grant
Full swath analysis
- Patent number 7,251,586
- Issue date Jul 31, 2007
- KLA-Tencor Technologies Corporation
- Krishnamurthy Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer inspection systems and methods for analyzing inspection data
- Patent number 7,227,628
- Issue date Jun 5, 2007
- KLA-Tencor Technologies Corp.
- Paul Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Status polling
- Patent number 7,181,368
- Issue date Feb 20, 2007
- KLA-Tencor Technologies Corporation
- Krishnamurthy Bhaskar
- G05 - CONTROLLING REGULATING
Information Patent Grant
Resolution enhancement for macro wafer inspection
- Patent number 7,176,433
- Issue date Feb 13, 2007
- KLA-Teacor Technologies Corporation
- Eliezer Rosengaus
- G01 - MEASURING TESTING
Information Patent Grant
Programmable image computer
- Patent number 7,149,642
- Issue date Dec 12, 2006
- KLA-Tencor Technologies Corporation
- Krishnamurthy Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Edge bead removal inspection by reflectometry
- Patent number 7,142,300
- Issue date Nov 28, 2006
- KLA-Tencor Corp. Technologies
- Eliezer Rosengaus
- G01 - MEASURING TESTING
Information Patent Grant
Memory load balancing
- Patent number 7,076,390
- Issue date Jul 11, 2006
- KLA-Tencor Technologies Corporation
- Krishnamurthy Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for inspection of specimen surfaces
- Patent number 7,072,034
- Issue date Jul 4, 2006
- KLA-Tencor Corporation
- Eliezer Rosengaus
- G01 - MEASURING TESTING
Information Patent Grant
Full swath analysis
- Patent number 7,024,339
- Issue date Apr 4, 2006
- KLA-Tencor Technologies Corporation
- Krishnamurthy Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Illumination delivery system
- Patent number 6,796,697
- Issue date Sep 28, 2004
- KLA-Tencor, Inc.
- Chris Bragg
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting semiconductor wafers
- Patent number 6,791,680
- Issue date Sep 14, 2004
- KLA-Tencor Corporation
- Eliezer Rosengaus
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting semiconductor wafers
- Patent number 6,020,957
- Issue date Feb 1, 2000
- KLA-Tencor Corporation
- Eliezer Rosengaus
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Systems and Methods for Region-Adaptive Defect Detection
- Publication number 20170140516
- Publication date May 18, 2017
- KLA-Tencor Corporation
- Christopher Maher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Acquisition of Information for a Construction Site
- Publication number 20130096873
- Publication date Apr 18, 2013
- KLA-Tencor Corporation
- Eliezer Rosengaus
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR CREATING PERSISTENT DATA FOR A WAFER AND FO...
- Publication number 20090080759
- Publication date Mar 26, 2009
- KLA-Tencor Corporation
- Kris Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Multi-spectral techniques for defocus detection
- Publication number 20080212089
- Publication date Sep 4, 2008
- Eliezer Rosengaus
- G01 - MEASURING TESTING
Information Patent Application
Status Polling
- Publication number 20070124095
- Publication date May 31, 2007
- KLA-Tencor Technologies Corporation
- Krishnamurthy Bhaskar
- G05 - CONTROLLING REGULATING
Information Patent Application
Edge bead removal inspection by reflectometry
- Publication number 20070019196
- Publication date Jan 25, 2007
- Eliezer (Reza) Rosengaus
- G01 - MEASURING TESTING
Information Patent Application
Programmable Image Computer
- Publication number 20070005284
- Publication date Jan 4, 2007
- KLA-Tencor Technologies Corporation
- Krishnamurthy Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Multi-spectral techniques for defocus detection
- Publication number 20060164649
- Publication date Jul 27, 2006
- Eliezer Rosengaus
- G01 - MEASURING TESTING
Information Patent Application
Full swath analysis
- Publication number 20060106580
- Publication date May 18, 2006
- KLA-Tencor Technologies Corporation
- Krishnamurthy Bhaskar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Edge bead removal inspection by reflectometry
- Publication number 20040223141
- Publication date Nov 11, 2004
- Eliezer Rosengaus
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods for inspection of specimen surfaces
- Publication number 20020186368
- Publication date Dec 12, 2002
- Eliezer Rosengaus
- G01 - MEASURING TESTING

Eliezer Rosengaus

Person

Patents Grantslast 30 patents

Systems and methods for inspection of a specimen

Systems and methods for region-adaptive defect detection

Acquisition of information for a construction site

Systems and methods for inspection of a specimen

Digital pathology system

Status polling

Method and system for hierarchical tissue analysis and classification

Systems and methods for creating persistent data for a wafer and fo...

Memory load balancing

Oblique incidence macro wafer inspection

Multi-spectral techniques for defocus detection

Mirror node process verification

Daisy chained topology

Wafer inspection systems and methods for analyzing inspection data

Surface scanning

Programmable image computer

Edge bead removal inspection by reflectometry

Wafer edge inspection apparatus

Full swath analysis

Wafer inspection systems and methods for analyzing inspection data

Status polling

Resolution enhancement for macro wafer inspection

Programmable image computer

Edge bead removal inspection by reflectometry

Memory load balancing

Systems and methods for inspection of specimen surfaces

Full swath analysis

Illumination delivery system

System and method for inspecting semiconductor wafers

System and method for inspecting semiconductor wafers

Patents Applicationslast 30 patents

Systems and Methods for Region-Adaptive Defect Detection

Acquisition of Information for a Construction Site

SYSTEMS AND METHODS FOR CREATING PERSISTENT DATA FOR A WAFER AND FO...

Multi-spectral techniques for defocus detection

Status Polling

Edge bead removal inspection by reflectometry

Programmable Image Computer

Multi-spectral techniques for defocus detection

Full swath analysis

Edge bead removal inspection by reflectometry

Systems and methods for inspection of specimen surfaces