Ellen R. Laird

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Dimensional calibration standards
- Patent number 7,453,571
- Issue date Nov 18, 2008
- KLA-Tencor Corporation
- Marco Tortonese
- G01 - MEASURING TESTING
Information Patent Grant
Dimensional calibration standards
- Patent number 7,301,638
- Issue date Nov 27, 2007
- KLA-Tencor, Inc.
- Marco Tortonese
- G01 - MEASURING TESTING
Information Patent Grant
Submicron dimensional calibration standards and methods of manufact...
- Patent number 6,646,737
- Issue date Nov 11, 2003
- KLA Tencor Technologies
- Marco Tortonese
- G01 - MEASURING TESTING
Information Patent Grant
Line width calibration standard manufacturing and certifying method
- Patent number 6,358,860
- Issue date Mar 19, 2002
- VLSI Standards, Inc.
- Bradley W. Scheer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for calibrating a topographic instrument
- Patent number 5,677,765
- Issue date Oct 14, 1997
- VLSI Standards, Inc.
- Ellen R. Laird
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Formation of atomic scale vertical features for topographic instrum...
- Patent number 5,599,464
- Issue date Feb 4, 1997
- VLSI Standards, Inc.
- Ellen R. Laird
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Submicron dimensional calibration standards and methods of manufact...
- Publication number 20030058437
- Publication date Mar 27, 2003
- Marco Tortonese
- B82 - NANO-TECHNOLOGY