Ellis S. Waldman

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Providence, RI, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for measurement of parameters of a flat material
- Patent number 8,174,258
- Issue date May 8, 2012
- Dolphin Measurement Systems LLC
- Alexander M. Raykhman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHODS FOR THICKNESS AND VELOCITY MEASUREMENT OF FLA...
- Publication number 20200292689
- Publication date Sep 17, 2020
- Dolphin Measurement System, LLC
- Ellis S. Waldman
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASUREMENT OF PARAMETERS OF A FLAT MATERIAL
- Publication number 20090281764
- Publication date Nov 12, 2009
- Alexander M. Raykhman
- G01 - MEASURING TESTING