Elmar Mayer

Person

Tacherting/Reit, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Position-measuring device and method for operating the same
- Patent number 11,537,294
- Issue date Dec 27, 2022
- Dr. Johannes Heidenhain GmbH
- Elmar Mayer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Position measuring device
- Patent number 10,260,909
- Issue date Apr 16, 2019
- Dr. Johannes Heidenhain GmbH
- Elmar Mayer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Position measuring device and method for operating a position measu...
- Patent number 10,260,908
- Issue date Apr 16, 2019
- Dr. Johannes Heidenhain GmbH
- Elmar Mayer
- G01 - MEASURING TESTING
Information Patent Grant
Position-measuring device able to monitor deviations from a setpoin...
- Patent number 10,197,388
- Issue date Feb 5, 2019
- Dr. Johannes Heidenhain GmbH
- Elmar Mayer
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for the automated detection of an interface
- Patent number 10,120,359
- Issue date Nov 6, 2018
- Dr. Johannes Heidenhain GmbH
- Elmar Mayer
- G05 - CONTROLLING REGULATING
Information Patent Grant
Moisture sensor arrangement
- Patent number 9,846,135
- Issue date Dec 19, 2017
- E+E Elektronik Ges.m.b.H.
- Elmar Mayer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for manipulating interface signals
- Patent number 9,768,990
- Issue date Sep 19, 2017
- Dr. Johannes Heidenhain GmbH
- Stephan Kreuzer
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for angle measurement
- Patent number 9,140,580
- Issue date Sep 22, 2015
- Dr. Johannes Heidenhain GmbH
- Steffen Bielski
- G01 - MEASURING TESTING
Information Patent Grant
Position-measuring device
- Patent number 8,820,623
- Issue date Sep 2, 2014
- Dr. Johannes Heidenhain GmbH
- Elmar Mayer
- G01 - MEASURING TESTING
Information Patent Grant
Multiturn rotary encoder
- Patent number 8,825,439
- Issue date Sep 2, 2014
- Dr. Johannes Heidenhain GmbH
- Elmar Mayer
- G01 - MEASURING TESTING
Information Patent Grant
Position measuring device
- Patent number 8,570,621
- Issue date Oct 29, 2013
- Dr. Johannes Heidenhain GmbH
- Jan Braasch
- G01 - MEASURING TESTING
Information Patent Grant
Angle-measuring device and line of products with such angle-measuri...
- Patent number 8,476,580
- Issue date Jul 2, 2013
- Dr. Johannes Heidenhain GmbH
- Elmar Mayer
- G01 - MEASURING TESTING
Information Patent Grant
Multiturn rotary encoder and method of operating a multiturn rotary...
- Patent number 8,154,427
- Issue date Apr 10, 2012
- Dr. Johannes Heidenhain GmbH
- Elmar Mayer
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for transmitting signals from a position measurin...
- Patent number 7,847,704
- Issue date Dec 7, 2010
- Dr. Johannes Heidenhain GmbH
- Johannes Wagner
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Position measuring arrangement
- Patent number 7,835,014
- Issue date Nov 16, 2010
- Dr. Johannes Heidenhain GmbH
- Elmar Mayer
- G01 - MEASURING TESTING
Information Patent Grant
Position-measuring device and method for position measuring
- Patent number 7,787,970
- Issue date Aug 31, 2010
- Dr. Johannes Heidenhain GmbH
- Erich Strasser
- G01 - MEASURING TESTING
Information Patent Grant
Scanning head for optical position-measuring systems
- Patent number 7,719,075
- Issue date May 18, 2010
- Dr. Johannes Heidenhain GmbH
- Peter Speckbacher
- G01 - MEASURING TESTING
Information Patent Grant
Scanner unit for an optical position measuring device
- Patent number RE40676
- Issue date Mar 24, 2009
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- 356 - Optics: measuring and testing
Information Patent Grant
Method and device for regulating a light source of a position-measu...
- Patent number 7,235,776
- Issue date Jun 26, 2007
- Johannes Heidenhain GmbH
- Elmar Mayer
- G01 - MEASURING TESTING
Information Patent Grant
Scanning unit for a position measuring instrument for optical scann...
- Patent number 7,230,726
- Issue date Jun 12, 2007
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Scanning unit for an optical position measuring device
- Patent number 7,214,928
- Issue date May 8, 2007
- Dr. Johannes Heidenhain GmbH
- Elmar J. Mayer
- G01 - MEASURING TESTING
Information Patent Grant
Detector array for optical encoders
- Patent number 7,199,354
- Issue date Apr 3, 2007
- Dr. Johannes Heidenhain GmbH
- Elmar Mayer
- G01 - MEASURING TESTING
Information Patent Grant
Position measuring system
- Patent number 7,164,482
- Issue date Jan 16, 2007
- Dr. Johannes Heidenhain GmbH
- Ulrich Benner
- G01 - MEASURING TESTING
Information Patent Grant
Position-measuring device including measuring graduation and scanni...
- Patent number 7,084,390
- Issue date Aug 1, 2006
- Dr. Johannes Heidenhain GmbH
- Elmar Mayer
- G01 - MEASURING TESTING
Information Patent Grant
Scanning unit for an optical position measuring device
- Patent number 6,965,437
- Issue date Nov 15, 2005
- Dr. Johannes Heidenhain GmbH
- Elmar J. Mayer
- G01 - MEASURING TESTING
Information Patent Grant
Optical position measuring device
- Patent number 6,963,409
- Issue date Nov 8, 2005
- Dr. Johannes Heidenhain GmbH
- Ulrich Benner
- G01 - MEASURING TESTING
Information Patent Grant
Optical device for measuring position
- Patent number 6,794,637
- Issue date Sep 21, 2004
- Dr. Johannas Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Scale and position measuring system for absolute position determina...
- Patent number 6,742,275
- Issue date Jun 1, 2004
- Dr. Johannes Heidenhain GmbH
- Elmar Mayer
- G01 - MEASURING TESTING
Information Patent Grant
Scanning head comprising a semiconductor substrate with a blind hol...
- Patent number 6,603,114
- Issue date Aug 5, 2003
- Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Grant
Scanner unit for an optical position measuring device
- Patent number 6,519,044
- Issue date Feb 11, 2003
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CIRCUIT ARRANGEMENT WITH A DIAGNOSTIC FUNCTION FOR ASICS AND METHOD...
- Publication number 20250067794
- Publication date Feb 27, 2025
- Dr. Johannes Heidenhain Gmbh
- Elmar MAYER
- G01 - MEASURING TESTING
Information Patent Application
POSITION-MEASURING DEVICE AND METHOD FOR OPERATING THE SAME
- Publication number 20210240361
- Publication date Aug 5, 2021
- Dr. Johannes Heidenhain Gmbh
- Elmar MAYER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POSITION MEASURING DEVICE AND METHOD FOR OPERATING A POSITION MEASU...
- Publication number 20180038715
- Publication date Feb 8, 2018
- Dr. Johannes Heidenhain Gmbh
- Elmar MAYER
- G01 - MEASURING TESTING
Information Patent Application
POSITION MEASURING DEVICE
- Publication number 20170030743
- Publication date Feb 2, 2017
- Dr. Johannes Heidenhain Gmbh
- Elmar MAYER
- G01 - MEASURING TESTING
Information Patent Application
Position-Measuring Device and Method for Operating the Position-Mea...
- Publication number 20130301059
- Publication date Nov 14, 2013
- Elmar Mayer
- G01 - MEASURING TESTING
Information Patent Application
MOISTURE SENSOR ARRANGEMENT
- Publication number 20130287062
- Publication date Oct 31, 2013
- E+E Elektronik Ges.m.b.H
- Elmar Mayer
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR ANGLE MEASUREMENT
- Publication number 20130030756
- Publication date Jan 31, 2013
- Steffen Bielski
- G01 - MEASURING TESTING
Information Patent Application
Device for Manipulating Interface Signals
- Publication number 20120030390
- Publication date Feb 2, 2012
- Stephan Kreuzer
- G05 - CONTROLLING REGULATING
Information Patent Application
ANGLE-MEASURING DEVICE AND LINE OF PRODUCTS COMPRISING SAID ANGLE-M...
- Publication number 20110290888
- Publication date Dec 1, 2011
- Elmar Mayer
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
POSITION MEASURING DEVICE
- Publication number 20110261422
- Publication date Oct 27, 2011
- Jan Braasch
- G01 - MEASURING TESTING
Information Patent Application
Device and Method for the Automated Detection of an Interface
- Publication number 20110258358
- Publication date Oct 20, 2011
- Dr. Johannes Heidenhain Gmbh
- Elmar Mayer
- G05 - CONTROLLING REGULATING
Information Patent Application
Multiturn Rotary Encoder
- Publication number 20110196648
- Publication date Aug 11, 2011
- Dr. Johannes Heidenhain GmbH
- Elmar Mayer
- G01 - MEASURING TESTING
Information Patent Application
Multiturn Rotary Encoder and Method of Operating a Multiturn Rotary...
- Publication number 20110063145
- Publication date Mar 17, 2011
- Elmar Mayer
- G01 - MEASURING TESTING
Information Patent Application
Position measuring arrangement
- Publication number 20090079996
- Publication date Mar 26, 2009
- Dr. Johannes Heidenhain GmbH
- Elmar Mayer
- G01 - MEASURING TESTING
Information Patent Application
Method and device for transmitting signals from a position measurin...
- Publication number 20090015423
- Publication date Jan 15, 2009
- Dr. Johannes Heidenhain GmbH
- Johannes Wagner
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
POSITION-MEASURING DEVICE
- Publication number 20080257951
- Publication date Oct 23, 2008
- Elmar MAYER
- G01 - MEASURING TESTING
Information Patent Application
Scanning Head for Optical Position-Measuring Systems
- Publication number 20070278486
- Publication date Dec 6, 2007
- Peter Speckbacher
- G01 - MEASURING TESTING
Information Patent Application
Detector array for optical encoders
- Publication number 20060043272
- Publication date Mar 2, 2006
- Elmar Mayer
- G01 - MEASURING TESTING
Information Patent Application
Position-measuring device and method for position measuring
- Publication number 20060009947
- Publication date Jan 12, 2006
- Erich Strasser
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Optical position measuring device
- Publication number 20050168757
- Publication date Aug 4, 2005
- Ulrich Benner
- G01 - MEASURING TESTING
Information Patent Application
Method and device for regulating a light source of a position-measu...
- Publication number 20050052641
- Publication date Mar 10, 2005
- Elmar Mayer
- G01 - MEASURING TESTING
Information Patent Application
Position-measuring device and scanning unit
- Publication number 20050051716
- Publication date Mar 10, 2005
- Elmar Mayer
- G01 - MEASURING TESTING
Information Patent Application
Scanning unit for position measuring instrument for optical scannin...
- Publication number 20040246500
- Publication date Dec 9, 2004
- Dr. Johannes Heidenhain GmbH
- Wolfgang Holzapfel
- G01 - MEASURING TESTING
Information Patent Application
Position measuring system
- Publication number 20040227958
- Publication date Nov 18, 2004
- Dr. Johannes Heidenhain GmbH
- Ulrich Benner
- G01 - MEASURING TESTING
Information Patent Application
Scanning unit for an optical position measuring device
- Publication number 20040119989
- Publication date Jun 24, 2004
- Elmar J Mayer
- G01 - MEASURING TESTING
Information Patent Application
Scanning unit for an optical position measuring device
- Publication number 20040046113
- Publication date Mar 11, 2004
- Elmar J. Mayer
- G01 - MEASURING TESTING
Information Patent Application
Scale and position measuring system for absolute position determina...
- Publication number 20030145479
- Publication date Aug 7, 2003
- Elmar Mayer
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Photoelectric position measuring system that optimizes modulation o...
- Publication number 20020011559
- Publication date Jan 31, 2002
- Elmar Mayer
- G01 - MEASURING TESTING

Elmar Mayer

Person

Patents Grantslast 30 patents

Position-measuring device and method for operating the same

Position measuring device

Position measuring device and method for operating a position measu...

Position-measuring device able to monitor deviations from a setpoin...

Device and method for the automated detection of an interface

Moisture sensor arrangement

Device for manipulating interface signals

Method and apparatus for angle measurement

Position-measuring device

Multiturn rotary encoder

Position measuring device

Angle-measuring device and line of products with such angle-measuri...

Multiturn rotary encoder and method of operating a multiturn rotary...

Method and device for transmitting signals from a position measurin...

Position measuring arrangement

Position-measuring device and method for position measuring

Scanning head for optical position-measuring systems

Scanner unit for an optical position measuring device

Method and device for regulating a light source of a position-measu...

Scanning unit for a position measuring instrument for optical scann...

Scanning unit for an optical position measuring device

Detector array for optical encoders

Position measuring system

Position-measuring device including measuring graduation and scanni...

Scanning unit for an optical position measuring device

Optical position measuring device

Optical device for measuring position

Scale and position measuring system for absolute position determina...

Scanning head comprising a semiconductor substrate with a blind hol...

Scanner unit for an optical position measuring device

Patents Applicationslast 30 patents

CIRCUIT ARRANGEMENT WITH A DIAGNOSTIC FUNCTION FOR ASICS AND METHOD...

POSITION-MEASURING DEVICE AND METHOD FOR OPERATING THE SAME

POSITION MEASURING DEVICE AND METHOD FOR OPERATING A POSITION MEASU...

POSITION MEASURING DEVICE

Position-Measuring Device and Method for Operating the Position-Mea...

MOISTURE SENSOR ARRANGEMENT

METHOD AND APPARATUS FOR ANGLE MEASUREMENT

Device for Manipulating Interface Signals

ANGLE-MEASURING DEVICE AND LINE OF PRODUCTS COMPRISING SAID ANGLE-M...

POSITION MEASURING DEVICE

Device and Method for the Automated Detection of an Interface

Multiturn Rotary Encoder

Multiturn Rotary Encoder and Method of Operating a Multiturn Rotary...

Position measuring arrangement

Method and device for transmitting signals from a position measurin...

POSITION-MEASURING DEVICE

Scanning Head for Optical Position-Measuring Systems

Detector array for optical encoders

Position-measuring device and method for position measuring

Optical position measuring device

Method and device for regulating a light source of a position-measu...

Position-measuring device and scanning unit

Scanning unit for position measuring instrument for optical scannin...

Position measuring system

Scanning unit for an optical position measuring device

Scanning unit for an optical position measuring device

Scale and position measuring system for absolute position determina...

Photoelectric position measuring system that optimizes modulation o...