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Tacherting/Reit, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Position-measuring device and method for operating the same
Patent number
11,537,294
Issue date
Dec 27, 2022
Dr. Johannes Heidenhain GmbH
Elmar Mayer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Device and method for the automated detection of an interface
Patent number
10,120,359
Issue date
Nov 6, 2018
Dr. Johannes Heidenhain GmbH
Elmar Mayer
G05 - CONTROLLING REGULATING
Information
Patent Grant
Moisture sensor arrangement
Patent number
9,846,135
Issue date
Dec 19, 2017
E+E Elektronik Ges.m.b.H.
Elmar Mayer
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Device for manipulating interface signals
Patent number
9,768,990
Issue date
Sep 19, 2017
Dr. Johannes Heidenhain GmbH
Stephan Kreuzer
G05 - CONTROLLING REGULATING
Information
Patent Grant
Method and apparatus for angle measurement
Patent number
9,140,580
Issue date
Sep 22, 2015
Dr. Johannes Heidenhain GmbH
Steffen Bielski
G01 - MEASURING TESTING
Information
Patent Grant
Position-measuring device
Patent number
8,820,623
Issue date
Sep 2, 2014
Dr. Johannes Heidenhain GmbH
Elmar Mayer
G01 - MEASURING TESTING
Information
Patent Grant
Multiturn rotary encoder
Patent number
8,825,439
Issue date
Sep 2, 2014
Dr. Johannes Heidenhain GmbH
Elmar Mayer
G01 - MEASURING TESTING
Information
Patent Grant
Position measuring device
Patent number
8,570,621
Issue date
Oct 29, 2013
Dr. Johannes Heidenhain GmbH
Jan Braasch
G01 - MEASURING TESTING
Information
Patent Grant
Angle-measuring device and line of products with such angle-measuri...
Patent number
8,476,580
Issue date
Jul 2, 2013
Dr. Johannes Heidenhain GmbH
Elmar Mayer
G01 - MEASURING TESTING
Information
Patent Grant
Multiturn rotary encoder and method of operating a multiturn rotary...
Patent number
8,154,427
Issue date
Apr 10, 2012
Dr. Johannes Heidenhain GmbH
Elmar Mayer
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for transmitting signals from a position measurin...
Patent number
7,847,704
Issue date
Dec 7, 2010
Dr. Johannes Heidenhain GmbH
Johannes Wagner
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Position measuring arrangement
Patent number
7,835,014
Issue date
Nov 16, 2010
Dr. Johannes Heidenhain GmbH
Elmar Mayer
G01 - MEASURING TESTING
Information
Patent Grant
Position-measuring device and method for position measuring
Patent number
7,787,970
Issue date
Aug 31, 2010
Dr. Johannes Heidenhain GmbH
Erich Strasser
G01 - MEASURING TESTING
Information
Patent Grant
Scanning head for optical position-measuring systems
Patent number
7,719,075
Issue date
May 18, 2010
Dr. Johannes Heidenhain GmbH
Peter Speckbacher
G01 - MEASURING TESTING
Information
Patent Grant
Scanner unit for an optical position measuring device
Patent number
RE40676
Issue date
Mar 24, 2009
Dr. Johannes Heidenhain GmbH
Wolfgang Holzapfel
356 - Optics: measuring and testing
Information
Patent Grant
Method and device for regulating a light source of a position-measu...
Patent number
7,235,776
Issue date
Jun 26, 2007
Johannes Heidenhain GmbH
Elmar Mayer
G01 - MEASURING TESTING
Information
Patent Grant
Scanning unit for a position measuring instrument for optical scann...
Patent number
7,230,726
Issue date
Jun 12, 2007
Dr. Johannes Heidenhain GmbH
Wolfgang Holzapfel
G01 - MEASURING TESTING
Information
Patent Grant
Scanning unit for an optical position measuring device
Patent number
7,214,928
Issue date
May 8, 2007
Dr. Johannes Heidenhain GmbH
Elmar J. Mayer
G01 - MEASURING TESTING
Information
Patent Grant
Detector array for optical encoders
Patent number
7,199,354
Issue date
Apr 3, 2007
Dr. Johannes Heidenhain GmbH
Elmar Mayer
G01 - MEASURING TESTING
Information
Patent Grant
Position measuring system
Patent number
7,164,482
Issue date
Jan 16, 2007
Dr. Johannes Heidenhain GmbH
Ulrich Benner
G01 - MEASURING TESTING
Information
Patent Grant
Position-measuring device including measuring graduation and scanni...
Patent number
7,084,390
Issue date
Aug 1, 2006
Dr. Johannes Heidenhain GmbH
Elmar Mayer
G01 - MEASURING TESTING
Information
Patent Grant
Scanning unit for an optical position measuring device
Patent number
6,965,437
Issue date
Nov 15, 2005
Dr. Johannes Heidenhain GmbH
Elmar J. Mayer
G01 - MEASURING TESTING
Information
Patent Grant
Optical position measuring device
Patent number
6,963,409
Issue date
Nov 8, 2005
Dr. Johannes Heidenhain GmbH
Ulrich Benner
G01 - MEASURING TESTING
Information
Patent Grant
Optical device for measuring position
Patent number
6,794,637
Issue date
Sep 21, 2004
Dr. Johannas Heidenhain GmbH
Wolfgang Holzapfel
G01 - MEASURING TESTING
Information
Patent Grant
Scale and position measuring system for absolute position determina...
Patent number
6,742,275
Issue date
Jun 1, 2004
Dr. Johannes Heidenhain GmbH
Elmar Mayer
G01 - MEASURING TESTING
Information
Patent Grant
Scanning head comprising a semiconductor substrate with a blind hol...
Patent number
6,603,114
Issue date
Aug 5, 2003
Johannes Heidenhain GmbH
Wolfgang Holzapfel
G01 - MEASURING TESTING
Information
Patent Grant
Scanner unit for an optical position measuring device
Patent number
6,519,044
Issue date
Feb 11, 2003
Dr. Johannes Heidenhain GmbH
Wolfgang Holzapfel
G01 - MEASURING TESTING
Information
Patent Grant
Photoelectric position measuring system that optimizes modulation o...
Patent number
6,472,658
Issue date
Oct 29, 2002
Dr. Johannes Heidenhain GmbH
Elmar Mayer
G01 - MEASURING TESTING
Information
Patent Grant
Scanning unit for an optical position measuring device
Patent number
6,392,224
Issue date
May 21, 2002
Dr. Johannes Heidenhain GmbH
Wolfgang Holzapfel
G01 - MEASURING TESTING
Information
Patent Grant
Optoelectronic component arrangement
Patent number
6,320,178
Issue date
Nov 20, 2001
Die Dr. Johannes Heidenhain GmbH
Stephan Miller
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
POSITION-MEASURING DEVICE AND METHOD FOR OPERATING THE SAME
Publication number
20210240361
Publication date
Aug 5, 2021
Dr. Johannes Heidenhain Gmbh
Elmar MAYER
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
POSITION MEASURING DEVICE
Publication number
20170030743
Publication date
Feb 2, 2017
Dr. Johannes Heidenhain Gmbh
Elmar MAYER
G01 - MEASURING TESTING
Information
Patent Application
Position-Measuring Device and Method for Operating the Position-Mea...
Publication number
20130301059
Publication date
Nov 14, 2013
Elmar Mayer
G01 - MEASURING TESTING
Information
Patent Application
MOISTURE SENSOR ARRANGEMENT
Publication number
20130287062
Publication date
Oct 31, 2013
E+E Elektronik Ges.m.b.H
Elmar Mayer
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR ANGLE MEASUREMENT
Publication number
20130030756
Publication date
Jan 31, 2013
Steffen Bielski
G01 - MEASURING TESTING
Information
Patent Application
Device for Manipulating Interface Signals
Publication number
20120030390
Publication date
Feb 2, 2012
Stephan Kreuzer
G05 - CONTROLLING REGULATING
Information
Patent Application
ANGLE-MEASURING DEVICE AND LINE OF PRODUCTS COMPRISING SAID ANGLE-M...
Publication number
20110290888
Publication date
Dec 1, 2011
Elmar Mayer
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
POSITION MEASURING DEVICE
Publication number
20110261422
Publication date
Oct 27, 2011
Jan Braasch
G01 - MEASURING TESTING
Information
Patent Application
Device and Method for the Automated Detection of an Interface
Publication number
20110258358
Publication date
Oct 20, 2011
Dr. Johannes Heidenhain Gmbh
Elmar Mayer
G05 - CONTROLLING REGULATING
Information
Patent Application
Multiturn Rotary Encoder
Publication number
20110196648
Publication date
Aug 11, 2011
Dr. Johannes Heidenhain GmbH
Elmar Mayer
G01 - MEASURING TESTING
Information
Patent Application
Multiturn Rotary Encoder and Method of Operating a Multiturn Rotary...
Publication number
20110063145
Publication date
Mar 17, 2011
Elmar Mayer
G01 - MEASURING TESTING
Information
Patent Application
Position measuring arrangement
Publication number
20090079996
Publication date
Mar 26, 2009
Dr. Johannes Heidenhain GmbH
Elmar Mayer
G01 - MEASURING TESTING
Information
Patent Application
Method and device for transmitting signals from a position measurin...
Publication number
20090015423
Publication date
Jan 15, 2009
Dr. Johannes Heidenhain GmbH
Johannes Wagner
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
POSITION-MEASURING DEVICE
Publication number
20080257951
Publication date
Oct 23, 2008
Elmar MAYER
G01 - MEASURING TESTING
Information
Patent Application
Scanning Head for Optical Position-Measuring Systems
Publication number
20070278486
Publication date
Dec 6, 2007
Peter Speckbacher
G01 - MEASURING TESTING
Information
Patent Application
Detector array for optical encoders
Publication number
20060043272
Publication date
Mar 2, 2006
Elmar Mayer
G01 - MEASURING TESTING
Information
Patent Application
Position-measuring device and method for position measuring
Publication number
20060009947
Publication date
Jan 12, 2006
Erich Strasser
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Optical position measuring device
Publication number
20050168757
Publication date
Aug 4, 2005
Ulrich Benner
G01 - MEASURING TESTING
Information
Patent Application
Method and device for regulating a light source of a position-measu...
Publication number
20050052641
Publication date
Mar 10, 2005
Elmar Mayer
G01 - MEASURING TESTING
Information
Patent Application
Position-measuring device and scanning unit
Publication number
20050051716
Publication date
Mar 10, 2005
Elmar Mayer
G01 - MEASURING TESTING
Information
Patent Application
Scanning unit for position measuring instrument for optical scannin...
Publication number
20040246500
Publication date
Dec 9, 2004
Dr. Johannes Heidenhain GmbH
Wolfgang Holzapfel
G01 - MEASURING TESTING
Information
Patent Application
Position measuring system
Publication number
20040227958
Publication date
Nov 18, 2004
Dr. Johannes Heidenhain GmbH
Ulrich Benner
G01 - MEASURING TESTING
Information
Patent Application
Scanning unit for an optical position measuring device
Publication number
20040119989
Publication date
Jun 24, 2004
Elmar J Mayer
G01 - MEASURING TESTING
Information
Patent Application
Scanning unit for an optical position measuring device
Publication number
20040046113
Publication date
Mar 11, 2004
Elmar J. Mayer
G01 - MEASURING TESTING
Information
Patent Application
Scale and position measuring system for absolute position determina...
Publication number
20030145479
Publication date
Aug 7, 2003
Elmar Mayer
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
Photoelectric position measuring system that optimizes modulation o...
Publication number
20020011559
Publication date
Jan 31, 2002
Elmar Mayer
G01 - MEASURING TESTING