Elmer Lawrence Allen Jr.

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Philadelphia, PA, US

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Patents Grantslast 30 patents

Information Patent Grant
Resistivity measurement system
- Patent number 4,220,915
- Issue date Sep 2, 1980
- RCA Corporation
- Hirohisa Kawamoto
- G01 - MEASURING TESTING
Information Patent Grant
Bias circuit for avalanche diodes
- Patent number 4,058,776
- Issue date Nov 15, 1977
- RCA Corporation
- Elmer Lawrence Allen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Mechanical structure for mounting microwave diode packages
- Patent number 3,943,469
- Issue date Mar 9, 1976
- RCA Corporation
- Hirohisa Kawamoto
- H01 - BASIC ELECTRIC ELEMENTS