Elmer Tyree York

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for detecting manufacturing marks on sputtered disks
- Patent number 6,600,556
- Issue date Jul 29, 2003
- Hitachi Global Storage Technologies Netherlands, B.V.
- Paul M. Green
- G01 - MEASURING TESTING
Information Patent Grant
Disk drive platter using sputter shadows thereon for determining or...
- Patent number 6,567,240
- Issue date May 20, 2003
- International Business Machines Corporation
- Bradley Frederick Baumgartner
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and method of using sputter shadows on disk for determini...
- Publication number 20020118630
- Publication date Aug 29, 2002
- International Business Machines Corporation
- Bradley Frederick Baumgartner
- G11 - INFORMATION STORAGE
Information Patent Application
System and method for detecting manufacturing marks on sputtered disks
- Publication number 20020089662
- Publication date Jul 11, 2002
- International Business Machines Corporation
- Paul M. Green
- G01 - MEASURING TESTING