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Emi KANEKO
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Kanagawa, JP
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Patents Grants
last 30 patents
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Patent Grant
Photoelectric encoder with optical grating
Patent number
8,658,964
Issue date
Feb 25, 2014
Mitutoyo Corporation
Emi Kaneko
G01 - MEASURING TESTING
Information
Patent Grant
Lens aberration correction in a doubly telecentric displacement sensor
Patent number
8,492,703
Issue date
Jul 23, 2013
Mitutoyo Corporation
Joseph D. Tobiason
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
PHOTOELECTRIC ENCODER
Publication number
20110095171
Publication date
Apr 28, 2011
Mitutoyo Corporation
Emi KANEKO
G01 - MEASURING TESTING
Information
Patent Application
LENS ABERRATION CORRECTION IN A DOUBLY TELECENTRIC DISPLACEMENT SENSOR
Publication number
20110031383
Publication date
Feb 10, 2011
Mitutoyo Corporation
Joseph D. Tobiason
G01 - MEASURING TESTING