Emi Miyata

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Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Radiation detection by dual-faced scintillation
- Patent number 7,358,500
- Issue date Apr 15, 2008
- Hamamatsu Photonics K.K.
- Emi Miyata
- G01 - MEASURING TESTING
Information Patent Grant
X-ray imaging device
- Patent number 7,002,155
- Issue date Feb 21, 2006
- Hamamatsu Photonics K.K.
- Emi Miyata
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Imaging device and imaging system
- Publication number 20060145083
- Publication date Jul 6, 2006
- Hamamatsu Photonics K.K.
- Emi Miyata
- G01 - MEASURING TESTING
Information Patent Application
X-ray imaging device
- Publication number 20040155198
- Publication date Aug 12, 2004
- Hamamatsu Photonics K.K.
- Emi Miyata
- G01 - MEASURING TESTING