TREA

Emiko USHIKU

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analyzer
    • Patent number 12,228,585
    • Issue date Feb 18, 2025
    • HITACHI HIGH-TECH CORPORATION
    • Nozomi Sagae
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    ELECTROLYTE ANALYSIS DEVICE AND METHOD FOR IDENTIFYING ABNORMALITY...
    • Publication number 20240060931
    • Publication date Feb 22, 2024
    • Hitachi High-Tech Corporation
    • Airi IWASAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20230135949
    • Publication date May 4, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Miwa TAKEUCHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20220326270
    • Publication date Oct 13, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Miki FURUYA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20220034930
    • Publication date Feb 3, 2022
    • Hitachi High-Tech Corporation
    • Nozomi Sagae
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER AND AUTOMATIC ANALYSIS METHOD
    • Publication number 20200256821
    • Publication date Aug 13, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Miwa TAKEUCHI
    • G01 - MEASURING TESTING