Emil I. Gizdarski

Person

Cupertino, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Scan chain formation for improving chain resolution
- Patent number 12,282,063
- Issue date Apr 22, 2025
- Synopsys, Inc.
- Emil Gizdarski
- G01 - MEASURING TESTING
Information Patent Grant
Testable time-to-digital converter
- Patent number 12,015,411
- Issue date Jun 18, 2024
- Synopsys, Inc.
- Emil Gizdarski
- G04 - HOROLOGY
Information Patent Grant
Single-pass diagnosis for multiple chain defects
- Patent number 11,789,077
- Issue date Oct 17, 2023
- Synopsys, Inc.
- Emil Gizdarski
- G01 - MEASURING TESTING
Information Patent Grant
Localization of multiple scan chain defects per scan chain
- Patent number 11,740,288
- Issue date Aug 29, 2023
- Synopsys, Inc.
- Emil I. Gizdarski
- G01 - MEASURING TESTING
Information Patent Grant
Cell-aware defect characterization by considering inter-cell timing
- Patent number 11,334,698
- Issue date May 17, 2022
- Synopsys, Inc.
- Ruifeng Guo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit design modification for localization of scan cha...
- Patent number 11,288,428
- Issue date Mar 29, 2022
- Synopsys, Inc.
- Emil I. Gizdarski
- G01 - MEASURING TESTING
Information Patent Grant
Reducing X-masking effect for linear time compactors
- Patent number 10,908,213
- Issue date Feb 2, 2021
- Synopsys, Inc.
- Emil Gizdarski
- G01 - MEASURING TESTING
Information Patent Grant
Power-aware dynamic encoding
- Patent number 10,380,303
- Issue date Aug 13, 2019
- Synopsys, Inc.
- Emil Gizdarski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Augmented power-aware decompressor
- Patent number 10,345,369
- Issue date Jul 9, 2019
- Synopsys, Inc.
- Emil Gizdarski
- G01 - MEASURING TESTING
Information Patent Grant
Diagnosis and debug with truncated simulation
- Patent number 9,404,972
- Issue date Aug 2, 2016
- Synopsys, Inc.
- Peter Wohl
- G01 - MEASURING TESTING
Information Patent Grant
Diagnosis and debug using truncated simulation
- Patent number 9,171,123
- Issue date Oct 27, 2015
- Synopsys, Inc.
- Peter Wohl
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Linear decompressor with two-step dynamic encoding
- Patent number 9,134,378
- Issue date Sep 15, 2015
- Synopsys, Inc.
- Emil I. Gizdarski
- G01 - MEASURING TESTING
Information Patent Grant
synthesizing circular decompressors
- Patent number 8,914,695
- Issue date Dec 16, 2014
- Synopsys, Inc.
- Emil I. Gizdarski
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for synthesis of multimode x-tolerant compressor
- Patent number 8,707,227
- Issue date Apr 22, 2014
- Synopsys, Inc.
- Emil Gizdarski
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for synthesis of augmented multimode compactors
- Patent number 8,103,926
- Issue date Jan 24, 2012
- Synopsys, Inc.
- Emil Gizdarski
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for synthesis of augmented multimode compactors
- Patent number 7,949,921
- Issue date May 24, 2011
- Synopsys, Inc.
- Emil Gizdarski
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically reconfigurable shared scan-in test architecture
- Patent number 7,900,105
- Issue date Mar 1, 2011
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for synthesis of augmented multimode compactors
- Patent number 7,882,409
- Issue date Feb 1, 2011
- Synopsys, Inc.
- Emil Gizdarski
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically reconfigurable shared scan-in test architecture
- Patent number 7,836,367
- Issue date Nov 16, 2010
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically reconfigurable shared scan-in test architecture
- Patent number 7,836,368
- Issue date Nov 16, 2010
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically reconfigurable shared scan-in test architecture
- Patent number 7,774,663
- Issue date Aug 10, 2010
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically reconfigurable shared scan-in test architecture
- Patent number 7,743,299
- Issue date Jun 22, 2010
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically reconfigurable shared scan-in test architecture
- Patent number 7,596,733
- Issue date Sep 29, 2009
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Grant
Dynamically reconfigurable shared scan-in test architecture
- Patent number 7,418,640
- Issue date Aug 26, 2008
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for synthesis of multimode X-tolerant compressor
- Patent number 7,415,678
- Issue date Aug 19, 2008
- Synopsys, Inc.
- Emil Gizdarski
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTABLE TIME-TO-DIGITAL CONVERTER
- Publication number 20220385280
- Publication date Dec 1, 2022
- Synopsys, Inc.
- Emil GIZDARSKI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SINGLE-PASS DIAGNOSIS FOR MULTIPLE CHAIN DEFECTS
- Publication number 20220128628
- Publication date Apr 28, 2022
- Synopsys, Inc.
- Emil Gizdarski
- G01 - MEASURING TESTING
Information Patent Application
Cell-Aware Defect Characterization by Considering Inter-Cell Timing
- Publication number 20210342511
- Publication date Nov 4, 2021
- Synopsys, Inc.
- Ruifeng Guo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POWER-AWARE DYNAMIC ENCODING
- Publication number 20170154132
- Publication date Jun 1, 2017
- Synopsys, Inc.
- Emil Gizdarski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIAGNOSIS AND DEBUG WITH TRUNCATED SIMULATION
- Publication number 20160025810
- Publication date Jan 28, 2016
- Synopsys, Inc.
- Peter Wohl
- G01 - MEASURING TESTING
Information Patent Application
LINEAR DECOMPRESSOR WITH TWO-STEP DYNAMIC ENCODING
- Publication number 20150100841
- Publication date Apr 9, 2015
- Synopsys, Inc.
- Emil I. Gizdarski
- G01 - MEASURING TESTING
Information Patent Application
DIAGNOSIS AND DEBUG USING TRUNCATED SIMULATION
- Publication number 20150067629
- Publication date Mar 5, 2015
- Synopsys, Inc.
- Peter Wohl
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUGMENTED POWER-AWARE DECOMPRESSOR
- Publication number 20140095101
- Publication date Apr 3, 2014
- Synopsys, Inc.
- Emil Gizdarski
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SYNTHESIZING CIRCULAR DECOMPRESSORS
- Publication number 20120239995
- Publication date Sep 20, 2012
- Synopsys, Inc.
- Emil I. Gizdarski
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Synthesis of Multimode X-Tolerant Compressor
- Publication number 20120072879
- Publication date Mar 22, 2012
- Synopsys, Inc.
- Emil Gizdarski
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Synthesis of Augmented Multimode Compactors
- Publication number 20110093752
- Publication date Apr 21, 2011
- Synopsys, Inc.
- Emil Gizdarski
- G01 - MEASURING TESTING
Information Patent Application
Dynamically Reconfigurable Shared Scan-In Test Architecture
- Publication number 20100223516
- Publication date Sep 2, 2010
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Application
Dynamically Reconfigurable Shared Scan-In Test Architecture
- Publication number 20100031101
- Publication date Feb 4, 2010
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Application
Dynamically Reconfigurable Shared Scan-In Test Architecture
- Publication number 20090313514
- Publication date Dec 17, 2009
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Application
Dynamically Reconfigurable Shared Scan-In Test Architecture
- Publication number 20090271673
- Publication date Oct 29, 2009
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Synthesis of Augmented Multimode Compactors
- Publication number 20090083596
- Publication date Mar 26, 2009
- Synopsys, Inc.
- Emil Gizdarski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and Apparatus for Synthesis of Augmented Multimode Compactors
- Publication number 20090083597
- Publication date Mar 26, 2009
- Synopsys, Inc.
- Emil Gizdarski
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Synthesis of Multimode X-Tolerant Compressor
- Publication number 20080313513
- Publication date Dec 18, 2008
- Synopsys, Inc.
- Emil Gizdarski
- G01 - MEASURING TESTING
Information Patent Application
Dynamically Reconfigurable Shared Scan-In Test Architecture
- Publication number 20080301510
- Publication date Dec 4, 2008
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Application
Dynamically Reconfigurable Shared Scan-In Test Architecture
- Publication number 20080294955
- Publication date Nov 27, 2008
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for synthesis of multimode X-tolerant compressor
- Publication number 20070113128
- Publication date May 17, 2007
- Synopsys, Inc.
- Emil Gizdarski
- G01 - MEASURING TESTING
Information Patent Application
Dynamically reconfigurable shared scan-in test architecture
- Publication number 20050268190
- Publication date Dec 1, 2005
- Synopsys, Inc.
- Rohit Kapur
- G01 - MEASURING TESTING

Emil I. Gizdarski

Person

Patents Grantslast 30 patents

Scan chain formation for improving chain resolution

Testable time-to-digital converter

Single-pass diagnosis for multiple chain defects

Localization of multiple scan chain defects per scan chain

Cell-aware defect characterization by considering inter-cell timing

Integrated circuit design modification for localization of scan cha...

Reducing X-masking effect for linear time compactors

Power-aware dynamic encoding

Augmented power-aware decompressor

Diagnosis and debug with truncated simulation

Diagnosis and debug using truncated simulation

Linear decompressor with two-step dynamic encoding

synthesizing circular decompressors

Method and apparatus for synthesis of multimode x-tolerant compressor

Method and apparatus for synthesis of augmented multimode compactors

Method and apparatus for synthesis of augmented multimode compactors

Dynamically reconfigurable shared scan-in test architecture

Method and apparatus for synthesis of augmented multimode compactors

Dynamically reconfigurable shared scan-in test architecture

Dynamically reconfigurable shared scan-in test architecture

Dynamically reconfigurable shared scan-in test architecture

Dynamically reconfigurable shared scan-in test architecture

Dynamically reconfigurable shared scan-in test architecture

Dynamically reconfigurable shared scan-in test architecture

Method and apparatus for synthesis of multimode X-tolerant compressor

Patents Applicationslast 30 patents

TESTABLE TIME-TO-DIGITAL CONVERTER

SINGLE-PASS DIAGNOSIS FOR MULTIPLE CHAIN DEFECTS

Cell-Aware Defect Characterization by Considering Inter-Cell Timing

POWER-AWARE DYNAMIC ENCODING

DIAGNOSIS AND DEBUG WITH TRUNCATED SIMULATION

LINEAR DECOMPRESSOR WITH TWO-STEP DYNAMIC ENCODING

DIAGNOSIS AND DEBUG USING TRUNCATED SIMULATION

AUGMENTED POWER-AWARE DECOMPRESSOR

METHOD AND APPARATUS FOR SYNTHESIZING CIRCULAR DECOMPRESSORS

Method and Apparatus for Synthesis of Multimode X-Tolerant Compressor

Method and Apparatus for Synthesis of Augmented Multimode Compactors

Dynamically Reconfigurable Shared Scan-In Test Architecture

Dynamically Reconfigurable Shared Scan-In Test Architecture

Dynamically Reconfigurable Shared Scan-In Test Architecture

Dynamically Reconfigurable Shared Scan-In Test Architecture

Method and Apparatus for Synthesis of Augmented Multimode Compactors

Method and Apparatus for Synthesis of Augmented Multimode Compactors

Method and Apparatus for Synthesis of Multimode X-Tolerant Compressor

Dynamically Reconfigurable Shared Scan-In Test Architecture

Dynamically Reconfigurable Shared Scan-In Test Architecture

Method and apparatus for synthesis of multimode X-tolerant compressor

Dynamically reconfigurable shared scan-in test architecture