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Emil I. Gizdarski
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Cupertino, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Testable time-to-digital converter
Patent number
12,015,411
Issue date
Jun 18, 2024
Synopsys, Inc.
Emil Gizdarski
G04 - HOROLOGY
Information
Patent Grant
Single-pass diagnosis for multiple chain defects
Patent number
11,789,077
Issue date
Oct 17, 2023
Synopsys, Inc.
Emil Gizdarski
G01 - MEASURING TESTING
Information
Patent Grant
Localization of multiple scan chain defects per scan chain
Patent number
11,740,288
Issue date
Aug 29, 2023
Synopsys, Inc.
Emil I. Gizdarski
G01 - MEASURING TESTING
Information
Patent Grant
Cell-aware defect characterization by considering inter-cell timing
Patent number
11,334,698
Issue date
May 17, 2022
Synopsys, Inc.
Ruifeng Guo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Integrated circuit design modification for localization of scan cha...
Patent number
11,288,428
Issue date
Mar 29, 2022
Synopsys, Inc.
Emil I. Gizdarski
G01 - MEASURING TESTING
Information
Patent Grant
Reducing X-masking effect for linear time compactors
Patent number
10,908,213
Issue date
Feb 2, 2021
Synopsys, Inc.
Emil Gizdarski
G01 - MEASURING TESTING
Information
Patent Grant
Power-aware dynamic encoding
Patent number
10,380,303
Issue date
Aug 13, 2019
Synopsys, Inc.
Emil Gizdarski
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Augmented power-aware decompressor
Patent number
10,345,369
Issue date
Jul 9, 2019
Synopsys, Inc.
Emil Gizdarski
G01 - MEASURING TESTING
Information
Patent Grant
Diagnosis and debug with truncated simulation
Patent number
9,404,972
Issue date
Aug 2, 2016
Synopsys, Inc.
Peter Wohl
G01 - MEASURING TESTING
Information
Patent Grant
Diagnosis and debug using truncated simulation
Patent number
9,171,123
Issue date
Oct 27, 2015
Synopsys, Inc.
Peter Wohl
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Linear decompressor with two-step dynamic encoding
Patent number
9,134,378
Issue date
Sep 15, 2015
Synopsys, Inc.
Emil I. Gizdarski
G01 - MEASURING TESTING
Information
Patent Grant
synthesizing circular decompressors
Patent number
8,914,695
Issue date
Dec 16, 2014
Synopsys, Inc.
Emil I. Gizdarski
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for synthesis of multimode x-tolerant compressor
Patent number
8,707,227
Issue date
Apr 22, 2014
Synopsys, Inc.
Emil Gizdarski
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for synthesis of augmented multimode compactors
Patent number
8,103,926
Issue date
Jan 24, 2012
Synopsys, Inc.
Emil Gizdarski
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for synthesis of augmented multimode compactors
Patent number
7,949,921
Issue date
May 24, 2011
Synopsys, Inc.
Emil Gizdarski
G01 - MEASURING TESTING
Information
Patent Grant
Dynamically reconfigurable shared scan-in test architecture
Patent number
7,900,105
Issue date
Mar 1, 2011
Synopsys, Inc.
Rohit Kapur
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for synthesis of augmented multimode compactors
Patent number
7,882,409
Issue date
Feb 1, 2011
Synopsys, Inc.
Emil Gizdarski
G01 - MEASURING TESTING
Information
Patent Grant
Dynamically reconfigurable shared scan-in test architecture
Patent number
7,836,367
Issue date
Nov 16, 2010
Synopsys, Inc.
Rohit Kapur
G01 - MEASURING TESTING
Information
Patent Grant
Dynamically reconfigurable shared scan-in test architecture
Patent number
7,836,368
Issue date
Nov 16, 2010
Synopsys, Inc.
Rohit Kapur
G01 - MEASURING TESTING
Information
Patent Grant
Dynamically reconfigurable shared scan-in test architecture
Patent number
7,774,663
Issue date
Aug 10, 2010
Synopsys, Inc.
Rohit Kapur
G01 - MEASURING TESTING
Information
Patent Grant
Dynamically reconfigurable shared scan-in test architecture
Patent number
7,743,299
Issue date
Jun 22, 2010
Synopsys, Inc.
Rohit Kapur
G01 - MEASURING TESTING
Information
Patent Grant
Dynamically reconfigurable shared scan-in test architecture
Patent number
7,596,733
Issue date
Sep 29, 2009
Synopsys, Inc.
Rohit Kapur
G01 - MEASURING TESTING
Information
Patent Grant
Dynamically reconfigurable shared scan-in test architecture
Patent number
7,418,640
Issue date
Aug 26, 2008
Synopsys, Inc.
Rohit Kapur
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for synthesis of multimode X-tolerant compressor
Patent number
7,415,678
Issue date
Aug 19, 2008
Synopsys, Inc.
Emil Gizdarski
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TESTABLE TIME-TO-DIGITAL CONVERTER
Publication number
20220385280
Publication date
Dec 1, 2022
Synopsys, Inc.
Emil GIZDARSKI
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
SINGLE-PASS DIAGNOSIS FOR MULTIPLE CHAIN DEFECTS
Publication number
20220128628
Publication date
Apr 28, 2022
Synopsys, Inc.
Emil Gizdarski
G01 - MEASURING TESTING
Information
Patent Application
Cell-Aware Defect Characterization by Considering Inter-Cell Timing
Publication number
20210342511
Publication date
Nov 4, 2021
Synopsys, Inc.
Ruifeng Guo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
POWER-AWARE DYNAMIC ENCODING
Publication number
20170154132
Publication date
Jun 1, 2017
Synopsys, Inc.
Emil Gizdarski
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DIAGNOSIS AND DEBUG WITH TRUNCATED SIMULATION
Publication number
20160025810
Publication date
Jan 28, 2016
Synopsys, Inc.
Peter Wohl
G01 - MEASURING TESTING
Information
Patent Application
LINEAR DECOMPRESSOR WITH TWO-STEP DYNAMIC ENCODING
Publication number
20150100841
Publication date
Apr 9, 2015
Synopsys, Inc.
Emil I. Gizdarski
G01 - MEASURING TESTING
Information
Patent Application
DIAGNOSIS AND DEBUG USING TRUNCATED SIMULATION
Publication number
20150067629
Publication date
Mar 5, 2015
Synopsys, Inc.
Peter Wohl
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AUGMENTED POWER-AWARE DECOMPRESSOR
Publication number
20140095101
Publication date
Apr 3, 2014
Synopsys, Inc.
Emil Gizdarski
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR SYNTHESIZING CIRCULAR DECOMPRESSORS
Publication number
20120239995
Publication date
Sep 20, 2012
Synopsys, Inc.
Emil I. Gizdarski
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Synthesis of Multimode X-Tolerant Compressor
Publication number
20120072879
Publication date
Mar 22, 2012
Synopsys, Inc.
Emil Gizdarski
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Synthesis of Augmented Multimode Compactors
Publication number
20110093752
Publication date
Apr 21, 2011
Synopsys, Inc.
Emil Gizdarski
G01 - MEASURING TESTING
Information
Patent Application
Dynamically Reconfigurable Shared Scan-In Test Architecture
Publication number
20100223516
Publication date
Sep 2, 2010
Synopsys, Inc.
Rohit Kapur
G01 - MEASURING TESTING
Information
Patent Application
Dynamically Reconfigurable Shared Scan-In Test Architecture
Publication number
20100031101
Publication date
Feb 4, 2010
Synopsys, Inc.
Rohit Kapur
G01 - MEASURING TESTING
Information
Patent Application
Dynamically Reconfigurable Shared Scan-In Test Architecture
Publication number
20090313514
Publication date
Dec 17, 2009
Synopsys, Inc.
Rohit Kapur
G01 - MEASURING TESTING
Information
Patent Application
Dynamically Reconfigurable Shared Scan-In Test Architecture
Publication number
20090271673
Publication date
Oct 29, 2009
Synopsys, Inc.
Rohit Kapur
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Synthesis of Augmented Multimode Compactors
Publication number
20090083596
Publication date
Mar 26, 2009
Synopsys, Inc.
Emil Gizdarski
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and Apparatus for Synthesis of Augmented Multimode Compactors
Publication number
20090083597
Publication date
Mar 26, 2009
Synopsys, Inc.
Emil Gizdarski
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Synthesis of Multimode X-Tolerant Compressor
Publication number
20080313513
Publication date
Dec 18, 2008
Synopsys, Inc.
Emil Gizdarski
G01 - MEASURING TESTING
Information
Patent Application
Dynamically Reconfigurable Shared Scan-In Test Architecture
Publication number
20080301510
Publication date
Dec 4, 2008
Synopsys, Inc.
Rohit Kapur
G01 - MEASURING TESTING
Information
Patent Application
Dynamically Reconfigurable Shared Scan-In Test Architecture
Publication number
20080294955
Publication date
Nov 27, 2008
Synopsys, Inc.
Rohit Kapur
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for synthesis of multimode X-tolerant compressor
Publication number
20070113128
Publication date
May 17, 2007
Synopsys, Inc.
Emil Gizdarski
G01 - MEASURING TESTING
Information
Patent Application
Dynamically reconfigurable shared scan-in test architecture
Publication number
20050268190
Publication date
Dec 1, 2005
Synopsys, Inc.
Rohit Kapur
G01 - MEASURING TESTING