Emil Kamieniecki

Person

Bedford, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Inductive radiation detector
- Patent number 10,338,237
- Issue date Jul 2, 2019
- Emil Kamieniecki
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Inductive radiation detector
- Patent number 10,018,738
- Issue date Jul 10, 2018
- Emil Kamieniecki
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Apparatus and method for electrical characterization by selecting a...
- Patent number 9,110,127
- Issue date Aug 18, 2015
- Nanometrics Incorporated
- Emil Kamieniecki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for electrical characterization by selecting a...
- Patent number 8,232,817
- Issue date Jul 31, 2012
- Nanometrics Incorporated
- Emil Kamieniecki
- G01 - MEASURING TESTING
Information Patent Grant
Electrical characterization of semiconductor materials
- Patent number 7,898,280
- Issue date Mar 1, 2011
- Emil Kamieniecki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for electrical characterization by selecting a...
- Patent number 7,663,385
- Issue date Feb 16, 2010
- Nanometrics Incorporated
- Emil Kamieniecki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INDUCTIVE RADIATION DETECTOR
- Publication number 20180348385
- Publication date Dec 6, 2018
- Emil KAMIENIECKI
- G01 - MEASURING TESTING
Information Patent Application
INDUCTIVE RADIATION DETECTOR
- Publication number 20170269239
- Publication date Sep 21, 2017
- Emil Kamieniecki
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR ELECTRICAL CHARACTERIZATION BY SELECTING A...
- Publication number 20120276665
- Publication date Nov 1, 2012
- Nanometrics Incorporated
- Emil Kamieniecki
- G01 - MEASURING TESTING
Information Patent Application
System and method for characterizing the electrical properties of a...
- Publication number 20110301892
- Publication date Dec 8, 2011
- Emil Kamieniecki
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Electrical Characterization by Selecting a...
- Publication number 20100156445
- Publication date Jun 24, 2010
- Nanometrics Incorporated
- Emil Kamieniecki
- G01 - MEASURING TESTING
Information Patent Application
Electrical Characterization of Semiconductor Materials
- Publication number 20100060307
- Publication date Mar 11, 2010
- Emil Kamieniecki
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Apparatus and Method for Electrical Characterization of Semiconductors
- Publication number 20070273400
- Publication date Nov 29, 2007
- Emil Kamieniecki
- G01 - MEASURING TESTING

Emil Kamieniecki

Person

Patents Grantslast 30 patents

Inductive radiation detector

Inductive radiation detector

Apparatus and method for electrical characterization by selecting a...

Apparatus and method for electrical characterization by selecting a...

Electrical characterization of semiconductor materials

Apparatus and method for electrical characterization by selecting a...

Patents Applicationslast 30 patents

INDUCTIVE RADIATION DETECTOR

INDUCTIVE RADIATION DETECTOR

APPARATUS AND METHOD FOR ELECTRICAL CHARACTERIZATION BY SELECTING A...

System and method for characterizing the electrical properties of a...

Apparatus and Method for Electrical Characterization by Selecting a...

Electrical Characterization of Semiconductor Materials

Apparatus and Method for Electrical Characterization of Semiconductors