Emil Peter SCHMITT-WEAVER

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Computational metrology
- Patent number 12,189,302
- Issue date Jan 7, 2025
- ASML Netherlands B.V.
- Wim Tjibbo Tel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for monitoring lithographic apparatus
- Patent number 12,032,297
- Issue date Jul 9, 2024
- ASML Netherlands B.V.
- Emil Peter Schmitt-Weaver
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of obtaining measurements, apparatus for performing a proces...
- Patent number 11,774,862
- Issue date Oct 3, 2023
- ASML Netherlands B.V.
- Hakki Ergün Cekli
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for monitoring a lithographic manufacturing p...
- Patent number 11,422,476
- Issue date Aug 23, 2022
- ASML Netherlands B.V.
- Emil Peter Schmitt-Weaver
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Computational metrology
- Patent number 11,347,150
- Issue date May 31, 2022
- ASML Netherlands B.V.
- Wim Tjibbo Tel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of obtaining measurements, apparatus for performing a proces...
- Patent number 11,175,591
- Issue date Nov 16, 2021
- ASML Netherlands B.V.
- Hakki Ergün Cekli
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mark position determination method
- Patent number 11,022,896
- Issue date Jun 1, 2021
- ASML Netherlands B.V.
- Emil Peter Schmitt-Weaver
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Computational metrology
- Patent number 10,990,018
- Issue date Apr 27, 2021
- ASML Netherlands B.V.
- Wim Tjibbo Tel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Calibration method for a lithographic apparatus
- Patent number 10,884,345
- Issue date Jan 5, 2021
- ASML Netherlands B.V.
- Emil Peter Schmitt-Weaver
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and apparatus for monitoring a lithographic manufacturing p...
- Patent number 10,866,527
- Issue date Dec 15, 2020
- ASML Netherlands B.V.
- Emil Peter Schmitt-Weaver
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for adjusting actuation of a lithographic apparatus
- Patent number 10,684,557
- Issue date Jun 16, 2020
- ASML Netherlands B.V.
- Rene Marinus Gerardus Johan Queens
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Calibration method for a lithographic apparatus
- Patent number 10,627,729
- Issue date Apr 21, 2020
- ASML Netherlands B.V.
- Emil Peter Schmitt-Weaver
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithographic apparatus with data processing apparatus
- Patent number 10,078,273
- Issue date Sep 18, 2018
- ASML Netherlands B.V.
- Emil Peter Schmitt-Weaver
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithography system and a machine learning controller for such a lit...
- Patent number 9,971,251
- Issue date May 15, 2018
- ASML Netherlands B.V.
- Emil Peter Schmitt-Weaver
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of calibrating a lithographic apparatus, device manufacturin...
- Patent number 9,715,181
- Issue date Jul 25, 2017
- ASML Netherlands B.V.
- Emil Peter Schmitt-Weaver
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of operating a lithographic apparatus, device manufacturing...
- Patent number 9,507,279
- Issue date Nov 29, 2016
- ASML Netherlands B.V.
- Emil Peter Schmitt-Weaver
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
COMPUTATIONAL METROLOGY
- Publication number 20220260925
- Publication date Aug 18, 2022
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF OBTAINING MEASUREMENTS, APPARATUS FOR PERFORMING A PROCES...
- Publication number 20220035259
- Publication date Feb 3, 2022
- ASML NETHERLANDS B.V.
- Hakki Ergün CEKLI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MONITORING LITHOGRAPHIC APPARATUS
- Publication number 20220026809
- Publication date Jan 27, 2022
- ASML NETHERLANDS B.V.
- Emil Peter SCHMITT-WEAVER
- G05 - CONTROLLING REGULATING
Information Patent Application
COMPUTATIONAL METROLOGY
- Publication number 20210191278
- Publication date Jun 24, 2021
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS & APPARATUS FOR MONITORING A LITHOGRAPHIC MANUFACTURING PRO...
- Publication number 20210018847
- Publication date Jan 21, 2021
- ASML NETHERLANDS B.V.
- Emil Peter SCHMITT-WEAVER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Calibration Method for a Lithographic Apparatus
- Publication number 20200218170
- Publication date Jul 9, 2020
- ASML NETHERLANDS B.V.
- Emil Peter SCHMITT-WEAVER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
System and Method for Measurement of Alignment
- Publication number 20200133144
- Publication date Apr 30, 2020
- ASML NETHERLANDS B.V.
- Emil Peter SCHMITT-WEAVER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS & APPARATUS FOR MONITORING A LITHOGRAPHIC MANUFACTURING PRO...
- Publication number 20200004164
- Publication date Jan 2, 2020
- ASML NETHERLANDS B.V.
- Emil Peter SCHMITT-WEAVER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
COMPUTATIONAL METROLOGY
- Publication number 20190361358
- Publication date Nov 28, 2019
- ASML NETHERLANDS B.V.
- Wim Tjibbo TEL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF OBTAINING MEASUREMENTS, APPARATUS FOR PERFORMING A PROCES...
- Publication number 20190137892
- Publication date May 9, 2019
- ASML NETHERLANDS B.V.
- Hakki Ergün CEKLI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ADJUSTING ACTUATION OF A LITHOGRAPHIC APPARATUS
- Publication number 20190094713
- Publication date Mar 28, 2019
- ASML NETHERLANDS B.V.
- Rene Marinus Gerardus Johan QUEENS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MARK POSITION DETERMINATION METHOD
- Publication number 20190064680
- Publication date Feb 28, 2019
- ASML NETHERLANDS B.V.
- Emil Peter SCHMITT-WEAVER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Calibration Method for a Lithographic Apparatus
- Publication number 20180173118
- Publication date Jun 21, 2018
- ASML NETHERLANDS B.V.
- Emil Peter SCHMITT-WEAVER
- G05 - CONTROLLING REGULATING
Information Patent Application
LITHOGRAPHIC APPARATUS WITH DATA PROCESSING APPARATUS
- Publication number 20160370711
- Publication date Dec 22, 2016
- ASML NETHERLANDS B.V.
- Emil Peter SCHMITT-WEAVER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
LITHOGRAPHY SYSTEM AND A MACHINE LEARNING CONTROLLER FOR SUCH A LIT...
- Publication number 20160170311
- Publication date Jun 16, 2016
- ASML NETHERLANDS B.V.
- Emil Peter SCHMITT-WEAVER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF CALIBRATING A LITHOGRAPHIC APPARATUS, DEVICE MANUFACTURIN...
- Publication number 20140168620
- Publication date Jun 19, 2014
- ASML NETHERLANDS B.V.
- Emil Peter SCHMITT-WEAVER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of Operating a Lithographic Apparatus, Device Manufacturing...
- Publication number 20140168627
- Publication date Jun 19, 2014
- ASML NETHERLANDS B.V.
- Emil Peter SCHMITT-WEAVER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Emil Peter SCHMITT-WEAVER

Person

Patents Grantslast 30 patents

Computational metrology

Method for monitoring lithographic apparatus

Method of obtaining measurements, apparatus for performing a proces...

Methods and apparatus for monitoring a lithographic manufacturing p...

Computational metrology

Method of obtaining measurements, apparatus for performing a proces...

Mark position determination method

Computational metrology

Calibration method for a lithographic apparatus

Methods and apparatus for monitoring a lithographic manufacturing p...

Method for adjusting actuation of a lithographic apparatus

Calibration method for a lithographic apparatus

Lithographic apparatus with data processing apparatus

Lithography system and a machine learning controller for such a lit...

Method of calibrating a lithographic apparatus, device manufacturin...

Method of operating a lithographic apparatus, device manufacturing...

Patents Applicationslast 30 patents

COMPUTATIONAL METROLOGY

METHOD OF OBTAINING MEASUREMENTS, APPARATUS FOR PERFORMING A PROCES...

METHOD FOR MONITORING LITHOGRAPHIC APPARATUS

COMPUTATIONAL METROLOGY

METHODS & APPARATUS FOR MONITORING A LITHOGRAPHIC MANUFACTURING PRO...

Calibration Method for a Lithographic Apparatus

System and Method for Measurement of Alignment

METHODS & APPARATUS FOR MONITORING A LITHOGRAPHIC MANUFACTURING PRO...

COMPUTATIONAL METROLOGY

METHOD OF OBTAINING MEASUREMENTS, APPARATUS FOR PERFORMING A PROCES...

METHOD FOR ADJUSTING ACTUATION OF A LITHOGRAPHIC APPARATUS

MARK POSITION DETERMINATION METHOD

Calibration Method for a Lithographic Apparatus

LITHOGRAPHIC APPARATUS WITH DATA PROCESSING APPARATUS

LITHOGRAPHY SYSTEM AND A MACHINE LEARNING CONTROLLER FOR SUCH A LIT...

METHOD OF CALIBRATING A LITHOGRAPHIC APPARATUS, DEVICE MANUFACTURIN...

Method of Operating a Lithographic Apparatus, Device Manufacturing...