Emil Weisz

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Modiin, IL

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Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope and a method for overlay monitoring
- Patent number 11,646,173
- Issue date May 9, 2023
- Applied Materials Israel Ltd.
- Itay Asulin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System, computer program product, and method for dissipation of an...
- Patent number 10,716,197
- Issue date Jul 14, 2020
- Applied Materials Israel Ltd.
- Guy Eytan
- G01 - MEASURING TESTING
Information Patent Grant
System and method for controlling specimen outgassing
- Patent number 9,583,307
- Issue date Feb 28, 2017
- Applied Materials Israel Ltd.
- Emil Weisz
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SCANNING ELECTRON MICROSCOPE AND A METHOD FOR OVERLAY MONITORING
- Publication number 20210335569
- Publication date Oct 28, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Itay Asulin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM, COMPUTER PROGRAM PRODUCT, AND METHOD FOR DISSIPATION OF AN...
- Publication number 20190090335
- Publication date Mar 21, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Guy Eytan
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
SYSTEM AND METHOD FOR CONTROLLING SPECIMEN OUTGASSING
- Publication number 20170004951
- Publication date Jan 5, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Emil Weisz
- H01 - BASIC ELECTRIC ELEMENTS