Emily Ann Donnelly

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Sachse, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for computer-aided design of radiation-hardened i...
- Patent number 10,242,151
- Issue date Mar 26, 2019
- TallannQuest LLC
- Emily Ann Donnelly
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for computer-aided design of radiation-hardened i...
- Patent number 9,779,203
- Issue date Oct 3, 2017
- TallannQuest LLC
- Emily Ann Donnelly
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for computer-aided design of radiation-hardened i...
- Patent number 9,569,583
- Issue date Feb 14, 2017
- TallannQuest LLC
- Emily Ann Donnelly
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for the analysis of semiconductor test data
- Patent number 7,171,335
- Issue date Jan 30, 2007
- Texas Instruments Incorporated
- Jin Liu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR COMPUTER-AIDED DESIGN OF RADIATION-HARDENED I...
- Publication number 20180096096
- Publication date Apr 5, 2018
- TallannQuest LLC
- Emily Ann Donnelly
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and system for computer-aided design of radiation-hardened i...
- Publication number 20170098028
- Publication date Apr 6, 2017
- TallannQuest LLC
- Emily Ann Donnelly
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and system for computer-aided design of radiation-hardened i...
- Publication number 20150286772
- Publication date Oct 8, 2015
- TallannQuest LLC
- Emily Ann Donnelly
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RADIATION HARDENED MOS DEVICES AND METHODS OF FABRICATION
- Publication number 20110084324
- Publication date Apr 14, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Emily Ann Donnelly
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method for the analysis of semiconductor test data
- Publication number 20060136174
- Publication date Jun 22, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Jin Liu
- G01 - MEASURING TESTING