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Emily True
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San Ramon, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Scanning methods for focus control for lithographic processing of r...
Patent number
10,269,662
Issue date
Apr 23, 2019
Ultratech, Inc.
Paul M. Bischoff
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Wynne-Dyson projection lens with reduced susceptibility to UV damage
Patent number
9,436,103
Issue date
Sep 6, 2016
Ultratech, Inc.
Peiqian Zhao
G02 - OPTICS
Information
Patent Grant
Substrate-alignment using detector of substrate material
Patent number
RE44116
Issue date
Apr 2, 2013
Ultratech, Inc.
Emily True
356 - Optics: measuring and testing
Information
Patent Grant
Sub-field enhanced global alignment
Patent number
8,299,446
Issue date
Oct 30, 2012
Ultratech, Inc.
Andrew M. Hawryluk
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Dual-sided substrate measurement apparatus and methods
Patent number
8,017,424
Issue date
Sep 13, 2011
Ultratech, Inc.
Albert J. Crespin
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Dual-sided substrate measurement apparatus and methods
Patent number
7,902,040
Issue date
Mar 8, 2011
Ultratech, Inc.
Albert J. Crespin
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Substrate-alignment using detector of substrate material
Patent number
7,751,067
Issue date
Jul 6, 2010
Ultratech, Inc.
Emily True
G01 - MEASURING TESTING
Information
Patent Grant
Dual-sided substrate measurement apparatus and methods
Patent number
7,528,937
Issue date
May 5, 2009
Ultratech, Inc.
Albert J. Crespin
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
Scanning Methods For Focus Control For Lithographic Processing Of R...
Publication number
20180166348
Publication date
Jun 14, 2018
Ultratech, Inc.
Paul M. Bischoff
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Wynne-Dyson projection lens with reduced susceptibility to UV damage
Publication number
20150331326
Publication date
Nov 19, 2015
Ultratech, Inc.
Peiqian Zhao
G02 - OPTICS
Information
Patent Application
Dual-sided substrate measurement apparatus and methods
Publication number
20110058731
Publication date
Mar 10, 2011
Ultratech, Inc.
Albert J. Crespin
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Sub-field enhanced global alignment
Publication number
20110038704
Publication date
Feb 17, 2011
Andrew M. Hawryluk
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY