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Emory J. Harry
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Aloha, OR, US
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last 30 patents
Information
Patent Grant
Probe adapter for electronic devices
Patent number
5,903,162
Issue date
May 11, 1999
Tektronix, Inc.
Paul A. Cole
G01 - MEASURING TESTING
Information
Patent Grant
Probe adapter for electronic device
Patent number
5,548,223
Issue date
Aug 20, 1996
Tektronix, Inc.
Paul A. Cole
G01 - MEASURING TESTING
Information
Patent Grant
Wideband high impedance card mountable probe
Patent number
4,783,625
Issue date
Nov 8, 1988
Tektronix, Inc.
Emory J. Harry
G01 - MEASURING TESTING
Information
Patent Grant
Telescoping pin probe
Patent number
4,739,259
Issue date
Apr 19, 1988
Tektronix, Inc.
Matthew J. Hadwin
G01 - MEASURING TESTING