En-Ping Lin

Person

Taoyuan City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Method of manufacturing a semiconductor device
- Patent number 12,165,873
- Issue date Dec 10, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- En-Ping Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for testing a filter
- Patent number 12,105,003
- Issue date Oct 1, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chwen Yu
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Measuring system and method of measuring static charges
- Patent number 12,020,962
- Issue date Jun 25, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Tzu-Sou Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Filter apparatus for semiconductor device fabrication process
- Patent number 11,826,709
- Issue date Nov 28, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chwen Yu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for processing a substrate by using fluid flowing through a...
- Patent number 11,668,639
- Issue date Jun 6, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- En-Tian Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a semiconductor device
- Patent number 11,328,931
- Issue date May 10, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- En-Ping Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Etching using chamber with top plate formed of non-oxygen containin...
- Patent number 11,120,986
- Issue date Sep 14, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- En-Ping Lin
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Particle detector
- Patent number 10,976,233
- Issue date Apr 13, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- En-Tian Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Etching using chamber with top plate formed of non-oxygen containin...
- Patent number 10,504,720
- Issue date Dec 10, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd
- En-Ping Lin
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR PRODUCING ULTRAPURE WATER FOR SEMICONDUCTOR...
- Publication number 20240383789
- Publication date Nov 21, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- En Tian Lin
- C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
Information Patent Application
INSPECTION METHOD AND RELATED INSPECTION DEVICE FOR OUT-OF-ORDER EX...
- Publication number 20240378060
- Publication date Nov 14, 2024
- Realtek Semiconductor Corp.
- Yean-Ru Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR TESTING A FILTER
- Publication number 20240369465
- Publication date Nov 7, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- CHWEN YU
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
MEASURING SYSTEM AND METHOD OF MEASURING STATIC CHARGES
- Publication number 20240304480
- Publication date Sep 12, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- TZU-SOU CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PROCESSING LIQUID CONTAINING AMMONIA NITROGEN FROM SEMICO...
- Publication number 20240043295
- Publication date Feb 8, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- EN TIAN LIN
- C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING CONCENTRATION OF COMPOUND IN U...
- Publication number 20240027411
- Publication date Jan 25, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- En-Tian LIN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR FILTER ANALYSIS AND REGENERATION
- Publication number 20230408393
- Publication date Dec 21, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- En Tian LIN
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
CHARGED PARTICLE FILTER AND REMOVAL SYSTEM
- Publication number 20230398475
- Publication date Dec 14, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- En Tian LIN
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
FILTER APPARATUS FOR SEMICONDUCTOR DEVICE FABRICATION PROCESS
- Publication number 20230372878
- Publication date Nov 23, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chwen YU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR PRODUCING ULTRAPURE WATER FOR SEMICONDUCTOR...
- Publication number 20230295027
- Publication date Sep 21, 2023
- TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY
- En Tian Lin
- C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
Information Patent Application
FILTER MEMBRANE AND METHOD FOR MAKING THE SAME
- Publication number 20230138216
- Publication date May 4, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- En-Tian LIN
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
SYSTEM AND METHOD FOR TESTING A FILTER
- Publication number 20230066472
- Publication date Mar 2, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- CHWEN YU
- G01 - MEASURING TESTING
Information Patent Application
MEASURING SYSTEM AND METHOD OF MEASURING STATIC CHARGES
- Publication number 20230063350
- Publication date Mar 2, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- TZU-SOU CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIN HEIGHT AND STI DEPTH FOR PERFORMANCE IMPROVEMENT IN SEMICONDUCT...
- Publication number 20220384273
- Publication date Dec 1, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Kun-Yu Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FILTER APPARATUS FOR SEMICONDUCTOR DEVICE FABRICATION PROCESS
- Publication number 20220379265
- Publication date Dec 1, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chwen YU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
- Publication number 20220270886
- Publication date Aug 25, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- En-Ping LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEEP TRENCH STRUCTURE FOR A CAPACITIVE DEVICE
- Publication number 20220157929
- Publication date May 19, 2022
- Taiwan Semiconductor Manufacturing Company Limited
- En-Shuo LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIN HEIGHT AND STI DEPTH FOR PERFORMANCE IMPROVEMENT IN SEMICONDUCT...
- Publication number 20220052042
- Publication date Feb 17, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Kun-Yu Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PROCESSING A SUBSTRATE BY USING FLUID FLOWING THROUGH A...
- Publication number 20210231553
- Publication date Jul 29, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- En-Tian Lin
- G01 - MEASURING TESTING
Information Patent Application
Particle detector
- Publication number 20200056978
- Publication date Feb 20, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- En-Tian Lin
- G01 - MEASURING TESTING
Information Patent Application
Etching Using Chamber with Top Plate Formed of Non-Oxygen Containin...
- Publication number 20200043720
- Publication date Feb 6, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- En-Ping Lin
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Etching Using Chamber with Top Plate Formed of Non-Oxygen Containin...
- Publication number 20180151353
- Publication date May 31, 2018
- Taiwan Semiconductor Manufacturing Company, Ltd.
- En-Ping Lin
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

En-Ping Lin

Person

Patents Grantslast 30 patents

Method of manufacturing a semiconductor device

System and method for testing a filter

Measuring system and method of measuring static charges

Filter apparatus for semiconductor device fabrication process

Method for processing a substrate by using fluid flowing through a...

Method of manufacturing a semiconductor device

Etching using chamber with top plate formed of non-oxygen containin...

Particle detector

Etching using chamber with top plate formed of non-oxygen containin...

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR PRODUCING ULTRAPURE WATER FOR SEMICONDUCTOR...

INSPECTION METHOD AND RELATED INSPECTION DEVICE FOR OUT-OF-ORDER EX...

SYSTEM AND METHOD FOR TESTING A FILTER

MEASURING SYSTEM AND METHOD OF MEASURING STATIC CHARGES

METHOD OF PROCESSING LIQUID CONTAINING AMMONIA NITROGEN FROM SEMICO...

METHOD AND APPARATUS FOR DETERMINING CONCENTRATION OF COMPOUND IN U...

SYSTEM FOR FILTER ANALYSIS AND REGENERATION

CHARGED PARTICLE FILTER AND REMOVAL SYSTEM

FILTER APPARATUS FOR SEMICONDUCTOR DEVICE FABRICATION PROCESS

SYSTEMS AND METHODS FOR PRODUCING ULTRAPURE WATER FOR SEMICONDUCTOR...

FILTER MEMBRANE AND METHOD FOR MAKING THE SAME

SYSTEM AND METHOD FOR TESTING A FILTER

MEASURING SYSTEM AND METHOD OF MEASURING STATIC CHARGES

FIN HEIGHT AND STI DEPTH FOR PERFORMANCE IMPROVEMENT IN SEMICONDUCT...

FILTER APPARATUS FOR SEMICONDUCTOR DEVICE FABRICATION PROCESS

METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE

DEEP TRENCH STRUCTURE FOR A CAPACITIVE DEVICE

FIN HEIGHT AND STI DEPTH FOR PERFORMANCE IMPROVEMENT IN SEMICONDUCT...

METHOD FOR PROCESSING A SUBSTRATE BY USING FLUID FLOWING THROUGH A...

Particle detector

Etching Using Chamber with Top Plate Formed of Non-Oxygen Containin...

Etching Using Chamber with Top Plate Formed of Non-Oxygen Containin...