Ender Yilmaz

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for built-in self test of low dropout regulators
- Patent number 9,933,802
- Issue date Apr 3, 2018
- NXP USA, INC.
- Jae Woong Jeong
- G05 - CONTROLLING REGULATING
Information Patent Grant
Functional path failure monitor
- Patent number 9,222,971
- Issue date Dec 29, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Xiaoxiao Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FUNCTIONAL PATH FAILURE MONITOR
- Publication number 20150121158
- Publication date Apr 30, 2015
- XIAOXIAO WANG
- G01 - MEASURING TESTING