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Ang Mo Kio, SG
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Patents Grants
last 30 patents
Information
Patent Grant
EEPROM cell structure and a method of fabricating the same
Patent number
8,564,043
Issue date
Oct 22, 2013
Systems on Silicon Manufacturing Co. Pte. Ltd.
Sheng He Huang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for detection of spatial signature yield loss
Patent number
7,400,391
Issue date
Jul 15, 2008
Systems on Silicon Manufacturing Co. Pte. Ltd.
Eng Keong Ho
G01 - MEASURING TESTING
Information
Patent Grant
System and method for detection of spatial signature yield loss
Patent number
7,211,450
Issue date
May 1, 2007
Systems on Silicon Manufacturing Co., Pte. Ltd.
Eng Keong Ho
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
EEPROM CELL STRUCTURE AND A METHOD OF FABRICATING THE SAME
Publication number
20120181594
Publication date
Jul 19, 2012
Systems on Silicon Manufacturing Co. PTE. LTD.
Sheng He HUANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
System and Method for Detection of Spatial Signature Yield Loss
Publication number
20070161132
Publication date
Jul 12, 2007
Systems on Silicon Manufacturing Co. PTE. LTD.
Eng Keong HO
G05 - CONTROLLING REGULATING
Information
Patent Application
System and method for process degradation problematic tool identifi...
Publication number
20060168484
Publication date
Jul 27, 2006
Eng Keong Ho
G05 - CONTROLLING REGULATING
Information
Patent Application
System and method for detection of spatial signature yield loss
Publication number
20060160254
Publication date
Jul 20, 2006
Eng Keong Ho
G05 - CONTROLLING REGULATING