Engmin J. Chern

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Columbia, MD, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for dual amplitude dual time-of-flight ultraso...
- Patent number 5,750,895
- Issue date May 12, 1998
- The United States of America as represented by the administrator of the Natio...
- Engmin James Chern
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for non-contact hole eccentricity and diameter...
- Patent number 5,339,031
- Issue date Aug 16, 1994
- The United States of America as represented by the Administrator, National Ae...
- Engmin J. Chern
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for deflection measurements using eddy current...
- Patent number 5,214,379
- Issue date May 25, 1993
- The United States of America as represented by the administrator of the Natio...
- Engmin J. Chern
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determination of material residual stress
- Patent number 5,193,395
- Issue date Mar 16, 1993
- The United States of America as represented by the administrator of the Natio...
- Engmin J. Chern
- G01 - MEASURING TESTING
Information Patent Grant
Method for advanced material characterization by laser induced eddy...
- Patent number 5,124,640
- Issue date Jun 23, 1992
- The United States of Americas as represented by the Administrator of the Nati...
- Engmin J. Chern
- G01 - MEASURING TESTING