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Enio OLIVEROS
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Montgomery, TX, US
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Patents Grants
last 30 patents
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Patent Grant
Metallic flaw detection system and method
Patent number
12,163,922
Issue date
Dec 10, 2024
SPScanco LLC
Enio Oliveros
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Metallic Flaw Detection System and Method
Publication number
20250052719
Publication date
Feb 13, 2025
SPSCANCO, LLC
Enio OLIVEROS
G01 - MEASURING TESTING
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Patent Application
METALLIC FLAW DETECTION SYSTEM AND METHOD
Publication number
20230324337
Publication date
Oct 12, 2023
SPSCANCO
Enio OLIVEROS
G01 - MEASURING TESTING