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Enno Lage

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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    AN INITIALISATION DEVICE
    • Publication number 20240004001
    • Publication date Jan 4, 2024
    • Analog Devices International Unlimited Company
    • Jochen Schmitt
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD OF MONITORING A MAGNETIC SENSOR
    • Publication number 20230168110
    • Publication date Jun 1, 2023
    • Analog Devices International Unlimited Company
    • Jochen Schmitt
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR SYSTEM
    • Publication number 20220308132
    • Publication date Sep 29, 2022
    • Analog Devices International Unlimited Company
    • Jochen Schmitt
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC SENSOR SYSTEM
    • Publication number 20220307865
    • Publication date Sep 29, 2022
    • Analog Devices International Unlimited Company
    • Jochen Schmitt
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETIC MULTI-TURN SENSOR AND METHOD OF MANUFACTURE
    • Publication number 20220075010
    • Publication date Mar 10, 2022
    • Analog Devices International Unlimited Company
    • Peter Meehan
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    METHOD OF MONITORING A MAGNETIC SENSOR
    • Publication number 20210372821
    • Publication date Dec 2, 2021
    • Analog Devices International Unlimited Company
    • Jochen Schmitt
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETORESISTIVE ELEMENT AND METHOD OF MANUFACTURE
    • Publication number 20210372820
    • Publication date Dec 2, 2021
    • Analog Devices International Unlimited Company
    • Jochen Schmitt
    • G01 - MEASURING TESTING
  • Information Patent Application

    MAGNETOSTRICTIVE LAYER SYSTEM
    • Publication number 20140125332
    • Publication date May 8, 2014
    • CHRISTIAN-ALBRECHTS-UNIVERSITAT ZU KIEL
    • Enno Lage
    • G01 - MEASURING TESTING