Enrico Bellandi

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Domodossola-Verbania, IT

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Patents Grantslast 30 patents

Information Patent Grant
Method of measuring the thickness of a layer of silicon damaged by...
- Patent number 6,233,046
- Issue date May 15, 2001
- STMicroelectronics S.r.l.
- Simone Alba
- G01 - MEASURING TESTING