Enrique Paz

Person

  • Ladera Ranch, CA, US

Patents Grantslast 30 patents

  • Information Patent Grant

    Thermal chamber for IC chip testing

    • Patent number 8,704,542
    • Issue date Apr 22, 2014
    • Titan Semiconductor Tool, LLC
    • Pongsak Tiengtum
    • F28 - HEAT EXCHANGE IN GENERAL

Patents Applicationslast 30 patents

  • Information Patent Application

    THERMAL CHAMBER FOR IC CHIP TESTING

    • Publication number 20130008628
    • Publication date Jan 10, 2013
    • Titan Semiconductor Tool, LLC
    • Pongsak Tiengtum
    • F28 - HEAT EXCHANGE IN GENERAL