Erez Ravid

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Jerusalem, IL

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Patents Grantslast 30 patents

Information Patent Grant
High throughput across-wafer-variation mapping
- Patent number 7,990,546
- Issue date Aug 2, 2011
- Applied Materials Israel, Ltd.
- Jeong Ho Yeo
- G01 - MEASURING TESTING
Information Patent Grant
On-the-fly automatic defect classification for substrates using sig...
- Patent number 6,256,093
- Issue date Jul 3, 2001
- Applied Materials, Inc.
- Erez Ravid
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HIGH THROUGHPUT ACROSS-WAFER-VARIATION MAPPING
- Publication number 20090021749
- Publication date Jan 22, 2009
- Jeong Ho Yeo
- G01 - MEASURING TESTING