Eri TAKAHASHI

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Patents Grantslast 30 patents

Information Patent Grant
Scintillator, measuring device, mass spectrometer, and electron mic...
- Patent number 12,072,454
- Issue date Aug 27, 2024
- HITACHI HIGH-TECH CORPORATION
- Shin Imamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scintillator for charged particle beam apparatus and charged partic...
- Patent number 11,846,736
- Issue date Dec 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Eri Takahashi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SCINTILLATOR AND CHARGED PARTICLE RADIATION APPARATUS
- Publication number 20230184704
- Publication date Jun 15, 2023
- HITACHI HIGH-TECH CORPORATION
- Eri TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
SCINTILLATOR, MEASURING DEVICE, MASS SPECTROMETER, AND ELECTRON MIC...
- Publication number 20220413169
- Publication date Dec 29, 2022
- HITACHI HIGH-TECH CORPORATION
- Shin IMAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCINTILLATOR FOR CHARGED PARTICLE BEAM APPARATUS AND CHARGED PARTIC...
- Publication number 20220244412
- Publication date Aug 4, 2022
- HITACHI HIGH-TECH CORPORATION
- Eri TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS