Eri UEMURA

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample contamination method
- Patent number 8,771,535
- Issue date Jul 8, 2014
- Kabushiki Kaisha Toshiba
- Yuji Yamada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CLEANLINESS MEASURING CARRIAGE AND CLEANLINESS MEASURING SYSTEM
- Publication number 20140230522
- Publication date Aug 21, 2014
- Kabushiki Kaisha Toshiba
- Eri UEMURA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE CONTAMINATION METHOD
- Publication number 20120149199
- Publication date Jun 14, 2012
- Yuji YAMADA
- G01 - MEASURING TESTING
Information Patent Application
MASK CLEANING METHOD, MASK CLEANING APPARATUS, AND PELLICLE
- Publication number 20110203611
- Publication date Aug 25, 2011
- Eri UEMURA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF CLEANING MASK AND MASK CLEANING APPARATUS
- Publication number 20110100393
- Publication date May 5, 2011
- Eri UEMURA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY