Eric Altman

Follow

Person

Guilford, CT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Tuned oscillator atomic force microscopy methods and apparatus
- Patent number 11,162,977
- Issue date Nov 2, 2021
- Yale University
- Udo Schwarz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TUNED OSCILLATOR ATOMIC FORCE MICROSCOPY METHODS AND APPARATUS
- Publication number 20190056428
- Publication date Feb 21, 2019
- Udo Schwarz
- G01 - MEASURING TESTING