Eric B. Selvin

Follow

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Programmable weak write test mode
- Patent number 6,778,450
- Issue date Aug 17, 2004
- Intel Corporation
- Eric B. Selvin
- G11 - INFORMATION STORAGE
Information Patent Grant
Automatic voltage detector control circuitry
- Patent number 5,343,086
- Issue date Aug 30, 1994
- Intel Corporation
- Wing-Cho Fung
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
Programmable weak write test mode
- Publication number 20030210593
- Publication date Nov 13, 2003
- Eric B. Selvin
- G11 - INFORMATION STORAGE