Eric Bouche

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Pleasanton, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Dynamic measurement control
- Patent number 7,606,677
- Issue date Oct 20, 2009
- KLA-Tencor Technologies Corporation
- Gary R. Janik
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Corona based charge voltage measurement
- Patent number 7,345,306
- Issue date Mar 18, 2008
- KLA-Tencor Technologies Corporation
- Sergio Edelstein
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring gate dielectric properties for three dimension...
- Patent number 7,109,735
- Issue date Sep 19, 2006
- KLA-Tencor Technologies Corporation
- Gary R. Janik
- G01 - MEASURING TESTING
Information Patent Grant
Corona based charge voltage measurement
- Patent number 7,098,050
- Issue date Aug 29, 2006
- KLA-Tencor Technologies Corporation
- Sergio Edelstein
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Full-wafer inspection methods having selectable pixel density
- Publication number 20170178980
- Publication date Jun 22, 2017
- Ultratech, Inc.
- David M. Owen
- G01 - MEASURING TESTING