Eric C. Van Every

Person

  • Lansing, NY, US

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    Ion chamber/beam position monitor

    • Publication number 20130112888
    • Publication date May 9, 2013
    • Alex K. Deyhim
    • G01 - MEASURING TESTING
  • Information Patent Application

    Optical exit slit

    • Publication number 20130108025
    • Publication date May 2, 2013
    • Alex K. Deyhim
    • G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
  • Information Patent Application

    Slit blade polishing procedure

    • Publication number 20130102226
    • Publication date Apr 25, 2013
    • Alex K. Deyhim
    • G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING