Membership
Tour
Register
Log in
Eric Chin Hong Ng
Follow
Person
Milpitas, CA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Spatial pattern loading measurement with imaging metrology
Patent number
12,211,717
Issue date
Jan 28, 2025
Applied Materials, Inc.
Eric Chin Hong Ng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Surface roughness and emissivity determination
Patent number
12,098,914
Issue date
Sep 24, 2024
Applied Materials, Inc.
Eric Chin Hong Ng
G01 - MEASURING TESTING
Information
Patent Grant
Optical metrology models for in-line film thickness measurements
Patent number
12,062,583
Issue date
Aug 13, 2024
Applied Materials Israel Ltd.
Eric Chin Hong Ng
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
SPATIAL PATTERN LOADING MEASUREMENT WITH IMAGING METROLOGY
Publication number
20250125171
Publication date
Apr 17, 2025
Applied Materials, Inc.
Eric Chin Hong Ng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SURFACE ROUGHNESS AND EMISSIVITY DETERMINATION
Publication number
20240110782
Publication date
Apr 4, 2024
Applied Materials, Inc.
Eric Chin Hong Ng
G01 - MEASURING TESTING
Information
Patent Application
SPATIAL PATTERN LOADING MEASUREMENT WITH IMAGING METROLOGY
Publication number
20220310425
Publication date
Sep 29, 2022
Applied Materials, Inc.
Eric Chin Hong Ng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OPTICAL METROLOGY MODELS FOR IN-LINE FILM THICKNESS MEASUREMENTS
Publication number
20220290974
Publication date
Sep 15, 2022
APPLIED MATERIALS ISRAEL LTD.
Eric Chin Hong Ng
G06 - COMPUTING CALCULATING COUNTING