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Eric Christensen
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Austin, TX, US
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last 30 patents
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Patent Grant
Integrated wafer stocker and sorter with integrity verification system
Patent number
6,431,814
Issue date
Aug 13, 2002
Advanced Micro Devices, Inc.
Eric Christensen
G01 - MEASURING TESTING
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Patent Grant
Integrated wafer stocker and sorter apparatus
Patent number
6,392,403
Issue date
May 21, 2002
Advanced Micro Devices, Inc.
Michael R. Conboy
G01 - MEASURING TESTING