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Eric D. Wilson
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Rockport, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Systems and methods for optimizing full horizontal scanned beam dis...
Patent number
12,191,113
Issue date
Jan 7, 2025
Applied Materials, Inc.
Tyler Wills
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Crucible design for liquid metal in an ion source
Patent number
11,854,760
Issue date
Dec 26, 2023
Applied Materials, Inc.
Graham Wright
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Extended cathode and repeller life by active management of halogen...
Patent number
11,664,183
Issue date
May 30, 2023
Applied Materials, Inc.
Graham Wright
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for calibration of substrate temperature using...
Patent number
11,543,296
Issue date
Jan 3, 2023
Applied Materials, Inc.
Eric D. Wilson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Techniques for determining and correcting for expected dose variati...
Patent number
11,264,205
Issue date
Mar 1, 2022
Applied Materials, Inc.
Eric Donald Wilson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for reduced workpiece adhesion due to electrostat...
Patent number
10,825,645
Issue date
Nov 3, 2020
Varian Semiconductor Equipment Associates, Inc.
Eric D. Wilson
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and techniques for beam mapping in ion beam system
Patent number
10,431,421
Issue date
Oct 1, 2019
Varian Semiconductor Equipment Associates, Inc.
Eric D. Wilson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method of opening a load lock door valve at a desired pr...
Patent number
9,817,407
Issue date
Nov 14, 2017
Varian Semiconductor Equipment Associates, Inc.
Bradley M. Pomerleau
G05 - CONTROLLING REGULATING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEMS AND METHODS FOR OPTIMIZING FULL HORIZONTAL SCANNED BEAM DIS...
Publication number
20230386785
Publication date
Nov 30, 2023
Applied Materials, Inc.
Tyler Wills
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FAST BEAM CALIBRATION PROCEDURE FOR BEAMLINE ION IMPLANTER
Publication number
20230057995
Publication date
Feb 23, 2023
Applied Materials, Inc.
George M. Gammel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHODS, MEDIUMS, AND SYSTEMS FOR IDENTIFYING TUNABLE DOMAINS FOR I...
Publication number
20230013095
Publication date
Jan 19, 2023
Applied Materials, Inc.
Richard Allen Sprenkle
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Crucible Design For Liquid Metal In An Ion Source
Publication number
20220406554
Publication date
Dec 22, 2022
Applied Materials, Inc.
Graham Wright
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Extended Cathode And Repeller Life By Active Management Of Halogen...
Publication number
20220359147
Publication date
Nov 10, 2022
Applied Materials, Inc.
Graham Wright
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TECHNIQUES FOR DETERMINING AND CORRECTING FOR EXPECTED DOSE VARIATI...
Publication number
20210175048
Publication date
Jun 10, 2021
Applied Materials, Inc.
Eric Donald Wilson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS FOR CALIBRATION OF SUBSTRATE TEMPERATURE USING...
Publication number
20200378832
Publication date
Dec 3, 2020
Applied Materials, Inc.
Eric D. Wilson
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND TECHNIQUES FOR BEAM MAPPING IN ION BEAM SYSTEM
Publication number
20200027698
Publication date
Jan 23, 2020
Varian Semiconductor Equipment Associates, Inc.
Eric D. Wilson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS AND TECHNIQUES FOR BEAM MAPPING IN ION BEAM SYSTEM
Publication number
20190139740
Publication date
May 9, 2019
Varian Semiconductor Equipment Associates, Inc.
Eric D. Wilson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
System And Method For Reduced Workpiece Adhesion Due To Electrostat...
Publication number
20190057835
Publication date
Feb 21, 2019
Varian Semiconductor Equipment Associates, Inc.
Eric D. Wilson
G01 - MEASURING TESTING
Information
Patent Application
System And Method Of Opening A Load Lock Door Valve At A Desired Pr...
Publication number
20160155653
Publication date
Jun 2, 2016
Varian Semiconductor Equipment Associates, Inc.
Bradley M. Pomerleau
H01 - BASIC ELECTRIC ELEMENTS