Eric E. Vogt

Person

Minneapolis, MN, US

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit stack including a patterned array of electricall...
- Patent number 9,997,466
- Issue date Jun 12, 2018
- Honeywell International Inc.
- Eric E. Vogt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit stack including a patterned array of electricall...
- Patent number 9,548,277
- Issue date Jan 17, 2017
- Honeywell International Inc.
- Eric E. Vogt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Programmable electrical fuse with temperature gradient between anod...
- Patent number 8,901,702
- Issue date Dec 2, 2014
- Honeywell International Inc.
- Eric E. Vogt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Modeling silicon-on-insulator stress effects
- Patent number 7,882,452
- Issue date Feb 1, 2011
- Honeywell International Inc.
- Eric E. Vogt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of forming a body-tie
- Patent number 7,732,287
- Issue date Jun 8, 2010
- Honeywell International Inc.
- Paul S. Fechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Simulating a dose rate event in a circuit design
- Patent number 7,322,015
- Issue date Jan 22, 2008
- Honeywell Internatinal Inc.
- Harry H. L. Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of incorporating magnetic materials in a semiconductor manuf...
- Patent number 7,238,541
- Issue date Jul 3, 2007
- Honeywell International Inc.
- Dale F. Berndt
- G11 - INFORMATION STORAGE
Information Patent Grant
Varactor with improved tuning range
- Patent number 7,169,679
- Issue date Jan 30, 2007
- Honeywell International Inc.
- Cheisan J. Yue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate length control for semiconductor chip design
- Patent number 6,939,758
- Issue date Sep 6, 2005
- Honeywell International Inc.
- Cheisan J. Yue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic sensor integrated with CMOS
- Patent number 6,903,429
- Issue date Jun 7, 2005
- Honeywell International, Inc.
- Dale F. Berndt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gate length control for semiconductor chip design
- Patent number 6,674,108
- Issue date Jan 6, 2004
- Honeywell International Inc.
- Cheisan J. Yue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Recessed silicon oxidation for devices such as a CMOS SOI ICs
- Patent number 6,465,324
- Issue date Oct 15, 2002
- Honeywell International Inc.
- Eric E. Vogt
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRICAL CONTACTS AND SYSTEMS AND TECHNIQUES FOR FORMING ELECTRIC...
- Publication number 20250239545
- Publication date Jul 24, 2025
- Honeywell International Inc.
- Bryan Roger Seppala
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
BONDING LAYER BETWEEN STACKED INTEGRATED CIRCUITS
- Publication number 20240347386
- Publication date Oct 17, 2024
- Honeywell International Inc.
- James L. Tucker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT STACK INCLUDING A PATTERNED ARRAY OF ELECTRICALL...
- Publication number 20170125352
- Publication date May 4, 2017
- HONEYWELL INTERNATIONAL INC.
- Eric E. Vogt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT STACK INCLUDING A PATTERNED ARRAY OF ELECTRICALL...
- Publication number 20160315055
- Publication date Oct 27, 2016
- Honeywell International Inc.
- Eric E. Vogt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROGRAMMABLE ELECTRICAL FUSE WITH TEMPERATURE GRADIENT BETWEEN ANOD...
- Publication number 20140332922
- Publication date Nov 13, 2014
- Honeywell International Inc.
- Eric E. Vogt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Modeling Silicon-On-Insulator Stress Effects
- Publication number 20090064062
- Publication date Mar 5, 2009
- Honeywell International Inc.
- Eric E. Vogt
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Fabrication process for silicon-on-insulator field effect transisto...
- Publication number 20080254590
- Publication date Oct 16, 2008
- Eric E. Vogt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of forming a body-tie
- Publication number 20070257317
- Publication date Nov 8, 2007
- Honeywell International Inc.
- Paul S. Fechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Body-tied MOSFET device with strained active area
- Publication number 20070257310
- Publication date Nov 8, 2007
- Honeywell International Inc.
- Weston Roper
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of straining a silicon island for mobility improvement
- Publication number 20070224838
- Publication date Sep 27, 2007
- Honeywell International Inc.
- Eric E. Vogt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dose rate simulation
- Publication number 20060145086
- Publication date Jul 6, 2006
- Honeywell International Inc.
- Harry H.L. Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of incorporating magnetic materials in a semiconductor manuf...
- Publication number 20050260774
- Publication date Nov 24, 2005
- Dale F. Berndt
- G11 - INFORMATION STORAGE
Information Patent Application
Method of incorporating magnetic materials in a semiconductor manuf...
- Publication number 20040257861
- Publication date Dec 23, 2004
- Dale F. Berndt
- G11 - INFORMATION STORAGE
Information Patent Application
Magnetic sensor integrated with CMOS
- Publication number 20040207031
- Publication date Oct 21, 2004
- Dale F. Berndt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gate length control for semiconductor chip design
- Publication number 20040021157
- Publication date Feb 5, 2004
- Cheisan J. Yue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Varactor with improved tuning range
- Publication number 20030127691
- Publication date Jul 10, 2003
- Honeywell International Inc.
- Cheisan J. Yue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RECESSED SILICON OXIDATION FOR DEVICES SUCH AS A CMOS SOI ICS
- Publication number 20020135017
- Publication date Sep 26, 2002
- Eric E. Vogt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gate resistance reduction
- Publication number 20020137345
- Publication date Sep 26, 2002
- Cheisan J. Yue
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gate length control for semiconductor chip design
- Publication number 20020074564
- Publication date Jun 20, 2002
- Cheisan J. Yue
- H01 - BASIC ELECTRIC ELEMENTS

Eric E. Vogt

Person

Patents Grantslast 30 patents

Integrated circuit stack including a patterned array of electricall...

Integrated circuit stack including a patterned array of electricall...

Programmable electrical fuse with temperature gradient between anod...

Modeling silicon-on-insulator stress effects

Method of forming a body-tie

Simulating a dose rate event in a circuit design

Method of incorporating magnetic materials in a semiconductor manuf...

Varactor with improved tuning range

Gate length control for semiconductor chip design

Magnetic sensor integrated with CMOS

Gate length control for semiconductor chip design

Recessed silicon oxidation for devices such as a CMOS SOI ICs

Patents Applicationslast 30 patents

ELECTRICAL CONTACTS AND SYSTEMS AND TECHNIQUES FOR FORMING ELECTRIC...

BONDING LAYER BETWEEN STACKED INTEGRATED CIRCUITS

INTEGRATED CIRCUIT STACK INCLUDING A PATTERNED ARRAY OF ELECTRICALL...

INTEGRATED CIRCUIT STACK INCLUDING A PATTERNED ARRAY OF ELECTRICALL...

PROGRAMMABLE ELECTRICAL FUSE WITH TEMPERATURE GRADIENT BETWEEN ANOD...

Modeling Silicon-On-Insulator Stress Effects

Fabrication process for silicon-on-insulator field effect transisto...

Method of forming a body-tie

Body-tied MOSFET device with strained active area

Method of straining a silicon island for mobility improvement

Dose rate simulation

Method of incorporating magnetic materials in a semiconductor manuf...

Method of incorporating magnetic materials in a semiconductor manuf...

Magnetic sensor integrated with CMOS

Gate length control for semiconductor chip design

Varactor with improved tuning range

RECESSED SILICON OXIDATION FOR DEVICES SUCH AS A CMOS SOI ICS

Gate resistance reduction

Gate length control for semiconductor chip design