Eric Hill

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for on-wafer dynamic testing of electronic devices
- Patent number 10,281,518
- Issue date May 7, 2019
- FormFactor Beaverton, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Grant
Probe head assemblies, components thereof, test systems including t...
- Patent number 9,989,558
- Issue date Jun 5, 2018
- Cascade Microtech, Inc.
- Koby Duckworth
- G01 - MEASURING TESTING
Information Patent Grant
Probe head assemblies, components thereof, test systems including t...
- Patent number 9,244,099
- Issue date Jan 26, 2016
- Cascade Microtech, Inc.
- Koby Duckworth
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Direct Metalized Guide Plate
- Publication number 20190120876
- Publication date Apr 25, 2019
- Jason William Cosman
- G01 - MEASURING TESTING
Information Patent Application
Probe Head with Inductance Reducing Structure
- Publication number 20180299486
- Publication date Oct 18, 2018
- Benjamin N. Eldridge
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD ASSEMBLIES, COMPONENTS THEREOF, TEST SYSTEMS INCLUDING T...
- Publication number 20160103153
- Publication date Apr 14, 2016
- Cascade Microtech, Inc.
- Koby Duckworth
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR ON-WAFER DYNAMIC TESTING OF ELECTRONIC DEVICES
- Publication number 20150241472
- Publication date Aug 27, 2015
- Cascade Microtech, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Application
RISERS INCLUDING A PLURALITY OF HIGH ASPECT RATIO ELECTRICAL CONDUI...
- Publication number 20130069680
- Publication date Mar 21, 2013
- Cascade Microtech, Inc.
- Koby L. Duckworth
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR TWO-SIDED TESTING OF ELECTRONIC D...
- Publication number 20130015871
- Publication date Jan 17, 2013
- Cascade Microtech, Inc.
- Tim Cleary
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD ASSEMBLIES, COMPONENTS THEREOF, TEST SYSTEMS INCLUDING T...
- Publication number 20120286817
- Publication date Nov 15, 2012
- Cascade Microtech, Inc.
- Koby Duckworth
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Systems and methods for on-wafer dynamic testing of electronic devices

Probe head assemblies, components thereof, test systems including t...

Probe head assemblies, components thereof, test systems including t...

Patents Applicationslast 30 patents

Direct Metalized Guide Plate

Probe Head with Inductance Reducing Structure

PROBE HEAD ASSEMBLIES, COMPONENTS THEREOF, TEST SYSTEMS INCLUDING T...

SYSTEMS AND METHODS FOR ON-WAFER DYNAMIC TESTING OF ELECTRONIC DEVICES

RISERS INCLUDING A PLURALITY OF HIGH ASPECT RATIO ELECTRICAL CONDUI...

SYSTEMS, DEVICES, AND METHODS FOR TWO-SIDED TESTING OF ELECTRONIC D...

PROBE HEAD ASSEMBLIES, COMPONENTS THEREOF, TEST SYSTEMS INCLUDING T...