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Eric Imhof
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Albuquerque, NM, US
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Patents Grants
last 30 patents
Information
Patent Grant
Vapor cell for atomic physics sensors
Patent number
12,188,784
Issue date
Jan 7, 2025
Northrop Grumman Systems Corporation
Eric A. Imhof
G01 - MEASURING TESTING
Information
Patent Grant
Electrometer sensor control system
Patent number
11,726,123
Issue date
Aug 15, 2023
Northrop Grumman Systems Corporation
Thad G. Walker
G01 - MEASURING TESTING
Information
Patent Grant
Electrometer with Rydberg frequency tuning
Patent number
11,674,992
Issue date
Jun 13, 2023
Northrop Grumman Systems Corporation
Thad G. Walker
G01 - MEASURING TESTING
Information
Patent Grant
Vector-sensitive electrometer
Patent number
11,346,877
Issue date
May 31, 2022
Northrop Grumman Systems Corporation
Eric A. Imhof
G01 - MEASURING TESTING
Information
Patent Grant
Grating magneto optical trap
Patent number
10,531,554
Issue date
Jan 7, 2020
Utah State University Space Dynamics Laboratory
Eric Imhof
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Grating magneto optical trap
Patent number
10,278,275
Issue date
Apr 30, 2019
Utah State University Research Foundation
Eric Imhof
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
ELECTROMETER WITH RADIO FREQUENCY (RF) TUNING WAVEGUIDE
Publication number
20240353462
Publication date
Oct 24, 2024
Northrop Grumman Systems Corporation
ERIC A. IMHOF
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMETER WITH RADIO FREQUENCY TUNING SIGNAL
Publication number
20240241162
Publication date
Jul 18, 2024
Northrop Grumman Systems Corporation
ERIC A. IMHOF
G01 - MEASURING TESTING
Information
Patent Application
MAGNETO-OPTICAL TRAP SYSTEM
Publication number
20240096513
Publication date
Mar 21, 2024
DORA CHAVEZ
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
ELECTROMETER WITH OPTICAL RYDBERG FREQUENCY TUNING
Publication number
20240085467
Publication date
Mar 14, 2024
Northrop Grumman Systems Corporation
ERIC A. IMHOF
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMETER SYSTEM WITH RYDBERG DECAY FLUORESCENCE DETECTION
Publication number
20240019476
Publication date
Jan 18, 2024
Northrop Grumman Systems Corporation
ERIC A. IMHOF
G01 - MEASURING TESTING
Information
Patent Application
ATOMIC OPTICAL REFERENCE SYSTEM
Publication number
20230333415
Publication date
Oct 19, 2023
Northrop Grumman Systems Corporation
ERIC A. IMHOF
G02 - OPTICS
Information
Patent Application
VAPOR CELL FOR ATOMIC PHYSICS SENSORS
Publication number
20220196444
Publication date
Jun 23, 2022
Northrop Grumman Systems Corporation
ERIC A. IMHOF
G04 - HOROLOGY
Information
Patent Application
ELECTROMETER SENSOR CONTROL SYSTEM
Publication number
20220196719
Publication date
Jun 23, 2022
Northrop Grumman Systems Corporation
THAD G. WALKER
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMETER WITH RYDBERG FREQUENCY TUNING
Publication number
20220196718
Publication date
Jun 23, 2022
Northrop Grumman Systems Corporation
THAD G. WALKER
G01 - MEASURING TESTING
Information
Patent Application
VECTOR-SENSITIVE ELECTROMETER
Publication number
20210270882
Publication date
Sep 2, 2021
Northrop Grumman Systems Corporation
ERIC A. IMHOF
G01 - MEASURING TESTING
Information
Patent Application
Grating Magneto Optical Trap
Publication number
20190200445
Publication date
Jun 27, 2019
UTAH STATE UNIVERSITY RESEARCH FOUNDATION
Eric Imhof
G02 - OPTICS
Information
Patent Application
Grating Magneto Optical Trap
Publication number
20170359888
Publication date
Dec 14, 2017
UTAH STATE UNIVERSITY RESEARCH FOUNDATION
Eric Imhof
G02 - OPTICS