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Eric J. Thorne
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Santa Cruz, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Increased usable programmable device dice
Patent number
9,372,956
Issue date
Jun 21, 2016
Xilinx, Inc.
Yuezhen Fan
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Integrated circuit package testing
Patent number
9,341,668
Issue date
May 17, 2016
XILNIX, INC.
Ganesh Hariharan
G01 - MEASURING TESTING
Information
Patent Grant
Method for determining interconnect line performance within an inte...
Patent number
7,373,538
Issue date
May 13, 2008
Xilinx, Inc.
Tarek Eldin
G01 - MEASURING TESTING
Information
Patent Grant
Test circuit for and method of identifying a defect in an integrate...
Patent number
7,227,364
Issue date
Jun 5, 2007
Xilinx, Inc.
Yuezhen Fan
G01 - MEASURING TESTING
Information
Patent Grant
Testing a programmable logic device with embedded fixed logic using...
Patent number
7,080,300
Issue date
Jul 18, 2006
Xilinx, Inc.
Nigel G. Herron
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for testing an interconnecting logic fabric
Patent number
6,996,758
Issue date
Feb 7, 2006
Xilinx, Inc.
Nigel G. Herron
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing circuitry embedded within a field...
Patent number
6,983,405
Issue date
Jan 3, 2006
Xilinx, Inc.,
Nigel G. Herron
G01 - MEASURING TESTING
Information
Patent Grant
Providing fault coverage of interconnect in an FPGA
Patent number
6,651,238
Issue date
Nov 18, 2003
Xilinx, Inc.
Robert W. Wells
G01 - MEASURING TESTING
Information
Patent Grant
Fault emulation testing of programmable logic devices
Patent number
6,594,610
Issue date
Jul 15, 2003
Xilinx, Inc.
Shahin Toutounchi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DUAL PORE - CONTROL AND SENSOR DEVICE
Publication number
20180372713
Publication date
Dec 27, 2018
Two Pore Guys, Inc.
Reto Stamm
B82 - NANO-TECHNOLOGY