Eric Kushnick

Person

Santa Clara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus to provide both high speed and low speed signa...
- Patent number 10,652,131
- Issue date May 12, 2020
- Advantest Corporation
- Michael Jones
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Universal test cell
- Patent number 10,161,962
- Issue date Dec 25, 2018
- Advantest Corporation
- Ben Rogel-Favila
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Test architecture having multiple FPGA based hardware accelerator b...
- Patent number 10,162,007
- Issue date Dec 25, 2018
- Advantest Corporation
- Gerald Chan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Universal container for device under test
- Patent number 9,995,767
- Issue date Jun 12, 2018
- Advantest Corporation
- Ben Rogel-Favila
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Universal test floor system
- Patent number 9,933,454
- Issue date Apr 3, 2018
- Advantest Corporation
- Ben Rogel-Favila
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
High speed tester communication interface between test slice and trays
- Patent number 9,310,427
- Issue date Apr 12, 2016
- Advantest Corporation
- Eric Kushnick
- G11 - INFORMATION STORAGE
Information Patent Grant
Histogram generation with mixed binning memory
- Patent number 8,327,090
- Issue date Dec 4, 2012
- Advantest Corporation
- Michael Frank Jones
- G01 - MEASURING TESTING
Information Patent Grant
Correcting apparatus, PDF measurement apparatus, jitter measurement...
- Patent number 8,312,327
- Issue date Nov 13, 2012
- Advantest Corporation
- Harry Hou
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for time vernier calibration
- Patent number 7,996,168
- Issue date Aug 9, 2011
- Advantest Corporation
- Eric Barr Kushnick
- G01 - MEASURING TESTING
Information Patent Grant
Histogram generation with banks for improved memory access performance
- Patent number 7,684,280
- Issue date Mar 23, 2010
- Advantest Corporation
- Michael Frank Jones
- G11 - INFORMATION STORAGE
Information Patent Grant
Synchronization of modules for analog and mixed signal testing in a...
- Patent number 7,672,805
- Issue date Mar 2, 2010
- Advantest Corporation
- Eric Barr Kushnick
- G01 - MEASURING TESTING
Information Patent Grant
Fabric-based high speed serial crossbar switch for ATE
- Patent number 7,620,858
- Issue date Nov 17, 2009
- Advantest Corporation
- Eric Barr Kushnick
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for improving the frequency resolution of a di...
- Patent number 7,606,849
- Issue date Oct 20, 2009
- Advantest Corporation
- Eric Barr Kushnick
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Carrier module for adapting non-standard instrument cards to test s...
- Patent number 7,463,018
- Issue date Dec 9, 2008
- Advantest Corporation
- Eric Barr Kushnick
- G01 - MEASURING TESTING
Information Patent Grant
Carrier module for adapting non-standard instrument cards to test s...
- Patent number 7,362,089
- Issue date Apr 22, 2008
- Advantest Corporation
- Eric Barr Kushnick
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method And Apparatus To Provide Both High Speed And Low Speed Signa...
- Publication number 20160036684
- Publication date Feb 4, 2016
- Advantest Corporation
- Michael Jones
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
UNIVERSAL TEST CELL
- Publication number 20150355231
- Publication date Dec 10, 2015
- Advantest Corporation
- Ben ROGEL-FAVILA
- G01 - MEASURING TESTING
Information Patent Application
UNIVERSAL TEST FLOOR SYSTEM
- Publication number 20150355229
- Publication date Dec 10, 2015
- Advantest Corporation
- Ben ROGEL-FAVILA
- G01 - MEASURING TESTING
Information Patent Application
UNIVERSAL CONTAINER FOR DEVICE UNDER TEST
- Publication number 20150355230
- Publication date Dec 10, 2015
- Advantest Corporation
- Ben ROGEL-FAVILA
- G01 - MEASURING TESTING
Information Patent Application
HIGH SPEED TESTER COMMUNICATION INTERFACE BETWEEN TEST SLICE AND TRAYS
- Publication number 20150028908
- Publication date Jan 29, 2015
- Advantest Corporation
- Eric KUSHNICK
- G01 - MEASURING TESTING
Information Patent Application
TEST ARCHITECTURE HAVING MULTIPLE FPGA BASED HARDWARE ACCELERATOR B...
- Publication number 20140236525
- Publication date Aug 21, 2014
- Advantest Corporation
- Gerald CHAN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF PROTECTING PROBES BY USING AN INTELLIGENT CURR...
- Publication number 20140070831
- Publication date Mar 13, 2014
- Advantest Corporation
- Eric Barr KUSHNICK
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSION CIRCUIT, DIFFERENTIAL SIGNAL TRANSMISSION CIRCUIT, AND...
- Publication number 20100278226
- Publication date Nov 4, 2010
- Advantest Corporation
- Eric Barr Kushnick
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CORRECTING APPARATUS, PDF MEASUREMENT APPARATUS, JITTER MEASUREMENT...
- Publication number 20100275072
- Publication date Oct 28, 2010
- Advantest Corporation
- HARRY HOU
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR TIME VERNIER CALIBRATION
- Publication number 20100229053
- Publication date Sep 9, 2010
- Advantest Corporation
- Eric Barr Kushnick
- G04 - HOROLOGY
Information Patent Application
HISTOGRAM GENERATION WITH BANKS FOR IMPROVED MEMORY ACCESS PERFORMANCE
- Publication number 20090103388
- Publication date Apr 23, 2009
- Advantest Corporation
- Michael Frank JONES
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
HISTOGRAM GENERATION WITH MIXED BINNING MEMORY
- Publication number 20090106512
- Publication date Apr 23, 2009
- Advantest Corporation
- Michael Frank JONES
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CARRIER MODULE FOR ADAPTING NON-STANDARD INSTRUMENT CARDS TO TEST S...
- Publication number 20080157804
- Publication date Jul 3, 2008
- Advantest Corporation
- Eric B. KUSHNICK
- G01 - MEASURING TESTING
Information Patent Application
CARRIER MODULE FOR ADAPTING NON-STANDARD INSTRUMENT CARDS TO TEST S...
- Publication number 20080157805
- Publication date Jul 3, 2008
- Advantest Corporation
- Eric Barr KUSHNICK
- G01 - MEASURING TESTING
Information Patent Application
Fabric-based high speed serial crossbar switch for ate
- Publication number 20080010568
- Publication date Jan 10, 2008
- Advantest Corporation
- Eric Barr Kushnick
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Carrier module for adapting non-standard instrument cards to test s...
- Publication number 20050261856
- Publication date Nov 24, 2005
- ADVANTEST CORPORATION
- Eric Barr Kushnick
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for improving the frequency resolution of a di...
- Publication number 20050248374
- Publication date Nov 10, 2005
- ADVANTES CORPORATION
- Eric Barr Kushnick
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Synchronization of modules for analog and mixed signal testing in a...
- Publication number 20050114550
- Publication date May 26, 2005
- ADVANTEST CORPORATION
- Eric Barr Kushnick
- G01 - MEASURING TESTING

Eric Kushnick

Person

Patents Grantslast 30 patents

Method and apparatus to provide both high speed and low speed signa...

Universal test cell

Test architecture having multiple FPGA based hardware accelerator b...

Universal container for device under test

Universal test floor system

High speed tester communication interface between test slice and trays

Histogram generation with mixed binning memory

Correcting apparatus, PDF measurement apparatus, jitter measurement...

Method and apparatus for time vernier calibration

Histogram generation with banks for improved memory access performance

Synchronization of modules for analog and mixed signal testing in a...

Fabric-based high speed serial crossbar switch for ATE

Method and apparatus for improving the frequency resolution of a di...

Carrier module for adapting non-standard instrument cards to test s...

Carrier module for adapting non-standard instrument cards to test s...

Patents Applicationslast 30 patents

Method And Apparatus To Provide Both High Speed And Low Speed Signa...

UNIVERSAL TEST CELL

UNIVERSAL TEST FLOOR SYSTEM

UNIVERSAL CONTAINER FOR DEVICE UNDER TEST

HIGH SPEED TESTER COMMUNICATION INTERFACE BETWEEN TEST SLICE AND TRAYS

TEST ARCHITECTURE HAVING MULTIPLE FPGA BASED HARDWARE ACCELERATOR B...

SYSTEM AND METHOD OF PROTECTING PROBES BY USING AN INTELLIGENT CURR...

TRANSMISSION CIRCUIT, DIFFERENTIAL SIGNAL TRANSMISSION CIRCUIT, AND...

CORRECTING APPARATUS, PDF MEASUREMENT APPARATUS, JITTER MEASUREMENT...

METHOD AND APPARATUS FOR TIME VERNIER CALIBRATION

HISTOGRAM GENERATION WITH BANKS FOR IMPROVED MEMORY ACCESS PERFORMANCE

HISTOGRAM GENERATION WITH MIXED BINNING MEMORY

CARRIER MODULE FOR ADAPTING NON-STANDARD INSTRUMENT CARDS TO TEST S...

CARRIER MODULE FOR ADAPTING NON-STANDARD INSTRUMENT CARDS TO TEST S...

Fabric-based high speed serial crossbar switch for ate

Carrier module for adapting non-standard instrument cards to test s...

Method and apparatus for improving the frequency resolution of a di...

Synchronization of modules for analog and mixed signal testing in a...