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Eric L. Christiansen
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Houston, TX, US
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Patents Grants
last 30 patents
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Patent Grant
Micrometeoroid and orbital debris impact detection and location usi...
Patent number
10,267,694
Issue date
Apr 23, 2019
The United States of America as represented by the Administrator of NASA
Steven L. Rickman
G01 - MEASURING TESTING
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Patent Grant
Impact detection system
Patent number
7,805,276
Issue date
Sep 28, 2010
The United States of America as represented by the administrator of the Natio...
Terry Byers
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Micrometeoroid and Orbital Debris Impact Detection and Location Usi...
Publication number
20170205297
Publication date
Jul 20, 2017
U.S.A. as represented by the Administrator of the National Aeronautics and Sp...
Steven L. Rickman
G01 - MEASURING TESTING