Eric Lee

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Allentown, PA, US

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Patents Grantslast 30 patents

Information Patent Grant
Highly secure and extensive scan testing of integrated circuits
- Patent number 8,977,917
- Issue date Mar 10, 2015
- Lattice Semiconductor Corporation
- Wei Han
- G11 - INFORMATION STORAGE
Information Patent Grant
Programmable logic device wakeup using a general purpose input/outp...
- Patent number 8,368,424
- Issue date Feb 5, 2013
- Lattice Semiconductor Corporation
- Wei Han
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Safe programming of key information into non-volatile memory for a...
- Patent number 8,319,521
- Issue date Nov 27, 2012
- Lattice Semiconductor Corporation
- Wei Han
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method of testing and diagnosing field programmable gate arrays
- Patent number 6,108,806
- Issue date Aug 22, 2000
- Lucent Technologies Inc.
- Miron Abramovici
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HIGHLY SECURE AND EXTENSIVE SCAN TESTING OF INTEGRATED CIRCUITS
- Publication number 20140136914
- Publication date May 15, 2014
- Lattice Semiconductor Corporation
- Wei Han
- G01 - MEASURING TESTING