Eric Lindbloom

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Poughkeepsie, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Weighted random pattern testing apparatus and method
- Patent number 4,801,870
- Issue date Jan 31, 1989
- International Business Machines Corporation
- Edward B. Eichelberger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Weighted random pattern testing apparatus and method
- Patent number 4,745,355
- Issue date May 17, 1988
- International Business Machines Corporation
- Edward B. Eichelberger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Weighted random pattern testing apparatus and method
- Patent number 4,687,988
- Issue date Aug 18, 1987
- International Business Machines Corporation
- Edward B. Eichelberger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Random pattern self test design
- Patent number 4,546,473
- Issue date Oct 8, 1985
- International Business Machines Corporation
- Edward B. Eichelberger
- H03 - BASIC ELECTRONIC CIRCUITRY