Eric M. Walstra

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Waterford, MI, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for optically inspecting parts
- Patent number 8,390,826
- Issue date Mar 5, 2013
- GII Acquisition, LLC
- Eric M. Walstra
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR OPTICALLY INSPECTING PARTS
- Publication number 20120268748
- Publication date Oct 25, 2012
- GII Acquisition, LLC dba General Inspection, LLC
- Eric M. Walstra
- G01 - MEASURING TESTING